Defect Identification using Positron Annihilation Spectroscopy (Q168350)
From geokb
Using positron annihilation to detect defects in materials like semiconductors, polymers.
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Defect Identification using Positron Annihilation Spectroscopy |
Using positron annihilation to detect defects in materials like semiconductors, polymers. |
