Item talk:Q168350

{

 "OpenAlex": {
   "display_name": "Defect Identification using Positron Annihilation Spectroscopy",
   "description": "This cluster of papers focuses on the use of positron annihilation spectroscopy to identify defects in semiconductors, porous materials, and polymers. It includes experimental and theoretical studies on topics such as annihilation lifetime, free volume, nanostructures, and the application of muons in defect characterization.",
   "keywords": [
     "Positron Annihilation",
     "Defect Identification",
     "Semiconductors",
     "Porous Materials",
     "Annihilation Lifetime",
     "Free Volume",
     "Nanostructures",
     "Polymers",
     "Muons",
     "Spectroscopy"
   ],
   "ids": {
     "openalex": "https://openalex.org/T12579",
     "wikipedia": "https://en.wikipedia.org/wiki/Positron_annihilation"
   },
   "subfield": {
     "id": "https://openalex.org/subfields/2211",
     "display_name": "Mechanics of Materials"
   },
   "field": {
     "id": "https://openalex.org/fields/22",
     "display_name": "Engineering"
   },
   "domain": {
     "id": "https://openalex.org/domains/3",
     "display_name": "Physical Sciences"
   },
   "updated_date": "2024-08-12T05:26:09.716075",
   "created_date": "2024-01-23",
   "type": "topic",
   "oa_id": "T12579",
   "id": "https://openalex.org/T12579"
 }

}