Item talk:Q77084

From geokb

{

 "USGS Publications Warehouse": {
   "schema": {
     "@context": "https://schema.org",
     "@type": "CreativeWork",
     "additionalType": "USGS Numbered Series",
     "name": "Quantitative characterization of micro-topography a bibliography of industrial surface metrology",
     "identifier": [
       {
         "@type": "PropertyValue",
         "propertyID": "USGS Publications Warehouse IndexID",
         "value": "ofr98768",
         "url": "https://pubs.usgs.gov/publication/ofr98768"
       },
       {
         "@type": "PropertyValue",
         "propertyID": "USGS Publications Warehouse Internal ID",
         "value": 24185
       },
       {
         "@type": "PropertyValue",
         "propertyID": "DOI",
         "value": "10.3133/ofr98768",
         "url": "https://doi.org/10.3133/ofr98768"
       },
       {
         "@type": "PropertyValue",
         "propertyID": "ISSN",
         "value": "0094-9140"
       }
     ],
     "inLanguage": "en",
     "isPartOf": [
       {
         "@type": "CreativeWorkSeries",
         "name": "Open-File Report"
       }
     ],
     "datePublished": "1998",
     "dateModified": "2012-02-02",
     "description": "145 p. :ill. ;28 cm.",
     "publisher": {
       "@type": "Organization",
       "name": "U.S. Dept. of the Interior, U.S. Geological Survey,"
     },
     "author": [
       {
         "@type": "Person",
         "name": "Thomas, T.R.",
         "givenName": "T.R.",
         "familyName": "Thomas"
       },
       {
         "@type": "Person",
         "name": "Pike, R.J.",
         "givenName": "R.J.",
         "familyName": "Pike"
       }
     ]
   }
 },
 "OpenAlex": {
   "abstract_inverted_index": null,
   "apc_list": null,
   "apc_paid": null,
   "authorships": [
     {
       "author_position": "first",
       "author": {
         "id": "https://openalex.org/A5081968129",
         "display_name": "Richard J. Pike",
         "orcid": null
       },
       "institutions": [],
       "countries": [],
       "is_corresponding": false,
       "raw_author_name": "R.J. Pike",
       "raw_affiliation_strings": [],
       "affiliations": []
     },
     {
       "author_position": "last",
       "author": {
         "id": "https://openalex.org/A5072950381",
         "display_name": "Tom Thomas",
         "orcid": "https://orcid.org/0000-0002-2188-3784"
       },
       "institutions": [],
       "countries": [],
       "is_corresponding": false,
       "raw_author_name": "T.R. Thomas",
       "raw_affiliation_strings": [],
       "affiliations": []
     }
   ],
   "best_oa_location": {
     "is_oa": true,
     "landing_page_url": "https://doi.org/10.3133/ofr98768",
     "pdf_url": "https://pubs.usgs.gov/of/1998/0768/report.pdf",
     "source": {
       "id": "https://openalex.org/S4210194219",
       "display_name": "Antarctica A Keystone in a Changing World",
       "issn_l": "0196-1497",
       "issn": [
         "0196-1497",
         "2331-1258",
         "2332-4899"
       ],
       "is_oa": true,
       "is_in_doaj": false,
       "is_core": true,
       "host_organization": "https://openalex.org/P4310316088",
       "host_organization_name": "United States Department of the Interior",
       "host_organization_lineage": [
         "https://openalex.org/P4310316088"
       ],
       "host_organization_lineage_names": [
         "United States Department of the Interior"
       ],
       "type": "journal"
     },
     "license": null,
     "license_id": null,
     "version": "publishedVersion",
     "is_accepted": true,
     "is_published": true
   },
   "biblio": {
     "volume": null,
     "issue": null,
     "first_page": null,
     "last_page": null
   },
   "citation_normalized_percentile": {
     "value": 0.756757,
     "is_in_top_1_percent": false,
     "is_in_top_10_percent": false
   },
   "cited_by_api_url": "https://api.openalex.org/works?filter=cites:W948131908",
   "cited_by_count": 7,
   "cited_by_percentile_year": {
     "min": 77,
     "max": 78
   },
   "concepts": [
     {
       "id": "https://openalex.org/c195766429",
       "wikidata": "https://www.wikidata.org/wiki/Q394",
       "display_name": "Metrology",
       "level": 2,
       "score": 0.7590207,
       "qid": null
     },
     {
       "id": "https://openalex.org/c2780841128",
       "wikidata": "https://www.wikidata.org/wiki/Q5073781",
       "display_name": "Characterization (materials science)",
       "level": 2,
       "score": 0.70904666,
       "qid": null
     },
     {
       "id": "https://openalex.org/c2776799497",
       "wikidata": "https://www.wikidata.org/wiki/Q484298",
       "display_name": "Surface (topology)",
       "level": 2,
       "score": 0.5386126,
       "qid": null
     },
     {
       "id": "https://openalex.org/c97002063",
       "wikidata": "https://www.wikidata.org/wiki/Q134995",
       "display_name": "Bibliography",
       "level": 2,
       "score": 0.50990236,
       "qid": null
     },
     {
       "id": "https://openalex.org/c2777625669",
       "wikidata": "https://www.wikidata.org/wiki/Q7645991",
       "display_name": "Surface metrology",
       "level": 4,
       "score": 0.5073895,
       "qid": null
     },
     {
       "id": "https://openalex.org/c192562407",
       "wikidata": "https://www.wikidata.org/wiki/Q228736",
       "display_name": "Materials science",
       "level": 0,
       "score": 0.34589782,
       "qid": "Q166092"
     },
     {
       "id": "https://openalex.org/c41008148",
       "wikidata": "https://www.wikidata.org/wiki/Q21198",
       "display_name": "Computer science",
       "level": 0,
       "score": 0.29883537,
       "qid": "Q158969"
     },
     {
       "id": "https://openalex.org/c171250308",
       "wikidata": "https://www.wikidata.org/wiki/Q11468",
       "display_name": "Nanotechnology",
       "level": 1,
       "score": 0.2893162,
       "qid": "Q226276"
     },
     {
       "id": "https://openalex.org/c120665830",
       "wikidata": "https://www.wikidata.org/wiki/Q14620",
       "display_name": "Optics",
       "level": 1,
       "score": 0.18083674,
       "qid": "Q226288"
     },
     {
       "id": "https://openalex.org/c161191863",
       "wikidata": "https://www.wikidata.org/wiki/Q199655",
       "display_name": "Library science",
       "level": 1,
       "score": 0.139988,
       "qid": "Q226257"
     },
     {
       "id": "https://openalex.org/c121332964",
       "wikidata": "https://www.wikidata.org/wiki/Q413",
       "display_name": "Physics",
       "level": 0,
       "score": 0.13394842,
       "qid": "Q166093"
     },
     {
       "id": "https://openalex.org/c33923547",
       "wikidata": "https://www.wikidata.org/wiki/Q395",
       "display_name": "Mathematics",
       "level": 0,
       "score": 0.12644789,
       "qid": "Q161189"
     },
     {
       "id": "https://openalex.org/c191897082",
       "wikidata": "https://www.wikidata.org/wiki/Q11467",
       "display_name": "Metallurgy",
       "level": 1,
       "score": 0.11637649,
       "qid": "Q226271"
     },
     {
       "id": "https://openalex.org/c79261456",
       "wikidata": "https://www.wikidata.org/wiki/Q443756",
       "display_name": "Profilometer",
       "level": 3,
       "score": 0.08934507,
       "qid": null
     },
     {
       "id": "https://openalex.org/c71039073",
       "wikidata": "https://www.wikidata.org/wiki/Q3439090",
       "display_name": "Surface finish",
       "level": 2,
       "score": 0.076010644,
       "qid": null
     },
     {
       "id": "https://openalex.org/c2524010",
       "wikidata": "https://www.wikidata.org/wiki/Q8087",
       "display_name": "Geometry",
       "level": 1,
       "score": 0.064712495,
       "qid": "Q226246"
     }
   ],
   "corresponding_author_ids": [],
   "corresponding_institution_ids": [],
   "countries_distinct_count": 0,
   "counts_by_year": [
     {
       "year": 2020,
       "cited_by_count": 1
     },
     {
       "year": 2019,
       "cited_by_count": 1
     },
     {
       "year": 2016,
       "cited_by_count": 1
     }
   ],
   "created_date": "2016-06-24",
   "datasets": [],
   "display_name": "Quantitative characterization of micro-topography a bibliography of industrial surface metrology",
   "doi": "https://doi.org/10.3133/ofr98768",
   "fwci": 4.268,
   "grants": [],
   "has_fulltext": false,
   "id": "https://openalex.org/W948131908",
   "ids": {
     "openalex": "https://openalex.org/W948131908",
     "doi": "https://doi.org/10.3133/ofr98768",
     "mag": "948131908"
   },
   "indexed_in": [
     "crossref"
   ],
   "institutions_distinct_count": 0,
   "is_paratext": false,
   "is_retracted": false,
   "keywords": [
     {
       "id": "https://openalex.org/keywords/characterization",
       "display_name": "Characterization (materials science)",
       "score": 0.70904666
     },
     {
       "id": "https://openalex.org/keywords/surface-characterization",
       "display_name": "Surface Characterization",
       "score": 0.624915
     },
     {
       "id": "https://openalex.org/keywords/micromorphology",
       "display_name": "Micromorphology",
       "score": 0.579781
     },
     {
       "id": "https://openalex.org/keywords/dimensional-metrology",
       "display_name": "Dimensional Metrology",
       "score": 0.550663
     },
     {
       "id": "https://openalex.org/keywords/large-scale-metrology",
       "display_name": "Large-Scale Metrology",
       "score": 0.532196
     },
     {
       "id": "https://openalex.org/keywords/microstructures",
       "display_name": "Microstructures",
       "score": 0.516142
     },
     {
       "id": "https://openalex.org/keywords/bibliography",
       "display_name": "Bibliography",
       "score": 0.50990236
     },
     {
       "id": "https://openalex.org/keywords/surface-metrology",
       "display_name": "Surface metrology",
       "score": 0.5073895
     }
   ],
   "language": "en",
   "locations": [
     {
       "is_oa": true,
       "landing_page_url": "https://doi.org/10.3133/ofr98768",
       "pdf_url": "https://pubs.usgs.gov/of/1998/0768/report.pdf",
       "source": {
         "id": "https://openalex.org/S4210194219",
         "display_name": "Antarctica A Keystone in a Changing World",
         "issn_l": "0196-1497",
         "issn": [
           "0196-1497",
           "2331-1258",
           "2332-4899"
         ],
         "is_oa": true,
         "is_in_doaj": false,
         "is_core": true,
         "host_organization": "https://openalex.org/P4310316088",
         "host_organization_name": "United States Department of the Interior",
         "host_organization_lineage": [
           "https://openalex.org/P4310316088"
         ],
         "host_organization_lineage_names": [
           "United States Department of the Interior"
         ],
         "type": "journal"
       },
       "license": null,
       "license_id": null,
       "version": "publishedVersion",
       "is_accepted": true,
       "is_published": true
     }
   ],
   "locations_count": 1,
   "mesh": [],
   "ngrams_url": "https://api.openalex.org/works/W948131908/ngrams",
   "open_access": {
     "is_oa": true,
     "oa_status": "bronze",
     "oa_url": "https://pubs.usgs.gov/of/1998/0768/report.pdf",
     "any_repository_has_fulltext": false
   },
   "primary_location": {
     "is_oa": true,
     "landing_page_url": "https://doi.org/10.3133/ofr98768",
     "pdf_url": "https://pubs.usgs.gov/of/1998/0768/report.pdf",
     "source": {
       "id": "https://openalex.org/S4210194219",
       "display_name": "Antarctica A Keystone in a Changing World",
       "issn_l": "0196-1497",
       "issn": [
         "0196-1497",
         "2331-1258",
         "2332-4899"
       ],
       "is_oa": true,
       "is_in_doaj": false,
       "is_core": true,
       "host_organization": "https://openalex.org/P4310316088",
       "host_organization_name": "United States Department of the Interior",
       "host_organization_lineage": [
         "https://openalex.org/P4310316088"
       ],
       "host_organization_lineage_names": [
         "United States Department of the Interior"
       ],
       "type": "journal"
     },
     "license": null,
     "license_id": null,
     "version": "publishedVersion",
     "is_accepted": true,
     "is_published": true
   },
   "primary_topic": {
     "id": "https://openalex.org/T11583",
     "display_name": "Dimensional Metrology and Error Compensation",
     "score": 0.9923,
     "subfield": {
       "id": "https://openalex.org/subfields/2210",
       "display_name": "Mechanical Engineering"
     },
     "field": {
       "id": "https://openalex.org/fields/22",
       "display_name": "Engineering"
     },
     "domain": {
       "id": "https://openalex.org/domains/3",
       "display_name": "Physical Sciences"
     }
   },
   "publication_date": "1998-01-01",
   "publication_year": 1998,
   "referenced_works": [],
   "referenced_works_count": 0,
   "related_works": [
     "https://openalex.org/W3110876097",
     "https://openalex.org/W2803122247",
     "https://openalex.org/W2790849961",
     "https://openalex.org/W2766211584",
     "https://openalex.org/W2141223895",
     "https://openalex.org/W2123234706",
     "https://openalex.org/W2031417299",
     "https://openalex.org/W2012934810",
     "https://openalex.org/W1988710656",
     "https://openalex.org/W1963918272"
   ],
   "sustainable_development_goals": [],
   "title": "Quantitative characterization of micro-topography a bibliography of industrial surface metrology",
   "topics": [
     {
       "id": "https://openalex.org/T11583",
       "display_name": "Dimensional Metrology and Error Compensation",
       "score": 0.9923,
       "subfield": {
         "id": "https://openalex.org/subfields/2210",
         "display_name": "Mechanical Engineering"
       },
       "field": {
         "id": "https://openalex.org/fields/22",
         "display_name": "Engineering"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     },
     {
       "id": "https://openalex.org/T13049",
       "display_name": "Characterization of Surface Roughness in Optical Components",
       "score": 0.9918,
       "subfield": {
         "id": "https://openalex.org/subfields/2206",
         "display_name": "Computational Mechanics"
       },
       "field": {
         "id": "https://openalex.org/fields/22",
         "display_name": "Engineering"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     },
     {
       "id": "https://openalex.org/T11799",
       "display_name": "Mechanics of Gecko Foot Adhesion",
       "score": 0.9522,
       "subfield": {
         "id": "https://openalex.org/subfields/2211",
         "display_name": "Mechanics of Materials"
       },
       "field": {
         "id": "https://openalex.org/fields/22",
         "display_name": "Engineering"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     }
   ],
   "type": "article",
   "type_crossref": "journal-article",
   "updated_date": "2024-08-10T09:29:16.564404",
   "versions": [],
   "qid": "Q77084"
 }

}