Item talk:Q334314

From geokb

{

 "OpenAlex": {
   "associated_institutions": [
     {
       "id": "https://openalex.org/I4210117926",
       "ror": "https://ror.org/02f7yzh91",
       "display_name": "GlobalFoundries (Cayman Islands)",
       "country_code": "KY",
       "type": "company",
       "relationship": "child"
     },
     {
       "id": "https://openalex.org/I4210142027",
       "ror": "https://ror.org/045jad561",
       "display_name": "GlobalFoundries (Germany)",
       "country_code": "DE",
       "type": "company",
       "relationship": "child"
     },
     {
       "id": "https://openalex.org/I4210136567",
       "ror": "https://ror.org/03whnfd14",
       "display_name": "GlobalFoundries (Singapore)",
       "country_code": "SG",
       "type": "company",
       "relationship": "child"
     },
     {
       "id": "https://openalex.org/I4210160050",
       "ror": "https://ror.org/054bpg497",
       "display_name": "GlobalFoundries (United Kingdom)",
       "country_code": "GB",
       "type": "company",
       "relationship": "child"
     }
   ],
   "cited_by_count": 21806,
   "country_code": "US",
   "counts_by_year": [
     {
       "year": 2024,
       "works_count": 60,
       "cited_by_count": 1222
     },
     {
       "year": 2023,
       "works_count": 66,
       "cited_by_count": 1943
     },
     {
       "year": 2022,
       "works_count": 68,
       "cited_by_count": 2024
     },
     {
       "year": 2021,
       "works_count": 78,
       "cited_by_count": 2141
     },
     {
       "year": 2020,
       "works_count": 112,
       "cited_by_count": 2065
     },
     {
       "year": 2019,
       "works_count": 149,
       "cited_by_count": 2096
     },
     {
       "year": 2018,
       "works_count": 248,
       "cited_by_count": 2044
     },
     {
       "year": 2017,
       "works_count": 244,
       "cited_by_count": 1790
     },
     {
       "year": 2016,
       "works_count": 260,
       "cited_by_count": 1559
     },
     {
       "year": 2015,
       "works_count": 204,
       "cited_by_count": 1227
     },
     {
       "year": 2014,
       "works_count": 215,
       "cited_by_count": 1119
     },
     {
       "year": 2013,
       "works_count": 183,
       "cited_by_count": 738
     },
     {
       "year": 2012,
       "works_count": 157,
       "cited_by_count": 549
     }
   ],
   "created_date": "2016-06-24",
   "display_name": "GlobalFoundries (United States)",
   "display_name_acronyms": [],
   "display_name_alternatives": [],
   "geo": {
     "city": "Santa Clara",
     "geonames_city_id": "5393015",
     "region": null,
     "country_code": "US",
     "country": "United States",
     "latitude": 37.35411,
     "longitude": -121.95524
   },
   "homepage_url": "https://www.globalfoundries.com/",
   "ids": {
     "openalex": "https://openalex.org/I35662394",
     "ror": "https://ror.org/02h0ps145",
     "mag": "35662394",
     "grid": "grid.482764.b",
     "wikipedia": "https://en.wikipedia.org/wiki/GlobalFoundries",
     "wikidata": "https://www.wikidata.org/wiki/Q691592"
   },
   "image_thumbnail_url": "https://commons.wikimedia.org/w/index.php?title=Special:Redirect/file/Aerial%20photograph%20of%20Globalfoundries%20Dresden.jpg&width=300",
   "image_url": "https://commons.wikimedia.org/w/index.php?title=Special:Redirect/file/Aerial%20photograph%20of%20Globalfoundries%20Dresden.jpg",
   "international": {
     "display_name": {
       "bn": "\u0997\u09cd\u09b2\u09cb\u09ac\u09be\u09b2\u09ab\u09be\u0989\u09a8\u09cd\u09a1\u09cd\u09b0\u09bf\u09b8",
       "ca": "GlobalFoundries",
       "cs": "GlobalFoundries",
       "da": "GlobalFoundries",
       "de": "Globalfoundries",
       "de-ch": "Globalfoundries",
       "en": "GlobalFoundries",
       "en-ca": "GlobalFoundries",
       "en-gb": "GlobalFoundries",
       "es": "GlobalFoundries",
       "fa": "\u06af\u0644\u0648\u0628\u0627\u0644\u200c\u0641\u0648\u0646\u062f\u0631\u06cc\u0632",
       "fi": "GlobalFoundries",
       "fr": "GlobalFoundries",
       "he": "GlobalFoundries",
       "id": "GlobalFoundries",
       "it": "GlobalFoundries",
       "ja": "GLOBALFOUNDRIES",
       "ko": "\uae00\ub85c\ubc8c\ud30c\uc6b4\ub4dc\ub9ac",
       "mg": "GlobalFoundries",
       "nl": "GlobalFoundries",
       "pl": "GlobalFoundries",
       "ru": "GlobalFoundries",
       "sk": "GlobalFoundries",
       "tt": "GlobalFoundries",
       "tt-cyrl": "GlobalFoundries",
       "vec": "GlobalFoundries",
       "wuu": "\u683c\u7f57\u65b9\u5fb7",
       "zh": "\u683c\u7f85\u65b9\u5fb7",
       "zh-hans": "\u683c\u7f57\u65b9\u5fb7",
       "zh-hant": "\u683c\u7f85\u65b9\u5fb7",
       "zh-hk": "\u683c\u7f85\u65b9\u5fb7"
     }
   },
   "is_super_system": false,
   "lineage": [
     "https://openalex.org/I35662394"
   ],
   "repositories": [],
   "roles": [
     {
       "role": "institution",
       "id": "https://openalex.org/I35662394",
       "works_count": 2387
     },
     {
       "role": "funder",
       "id": "https://openalex.org/F4320318301",
       "works_count": 33
     }
   ],
   "ror": "https://ror.org/02h0ps145",
   "summary_stats": {
     "2yr_mean_citedness": 0.9931506849315068,
     "h_index": 58,
     "i10_index": 527
   },
   "topic_share": [
     {
       "id": "https://openalex.org/T11338",
       "display_name": "Electron Beam Lithography: Resolution and Applications",
       "value": 0.0056744,
       "subfield": {
         "id": "https://openalex.org/subfields/2208",
         "display_name": "Electrical and Electronic Engineering"
       },
       "field": {
         "id": "https://openalex.org/fields/22",
         "display_name": "Engineering"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     },
     {
       "id": "https://openalex.org/T14117",
       "display_name": "Failure Analysis of Integrated Circuits",
       "value": 0.0031203,
       "subfield": {
         "id": "https://openalex.org/subfields/2208",
         "display_name": "Electrical and Electronic Engineering"
       },
       "field": {
         "id": "https://openalex.org/fields/22",
         "display_name": "Engineering"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     },
     {
       "id": "https://openalex.org/T11527",
       "display_name": "Three-Dimensional Integrated Circuits",
       "value": 0.0019978,
       "subfield": {
         "id": "https://openalex.org/subfields/2208",
         "display_name": "Electrical and Electronic Engineering"
       },
       "field": {
         "id": "https://openalex.org/fields/22",
         "display_name": "Engineering"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     },
     {
       "id": "https://openalex.org/T11661",
       "display_name": "Low Dielectric Constant Materials for Microelectronics",
       "value": 0.0019287,
       "subfield": {
         "id": "https://openalex.org/subfields/2504",
         "display_name": "Electronic, Optical and Magnetic Materials"
       },
       "field": {
         "id": "https://openalex.org/fields/25",
         "display_name": "Materials Science"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     },
     {
       "id": "https://openalex.org/T12808",
       "display_name": "Ferroelectric Devices for Low-Power Nanoscale Applications",
       "value": 0.001775,
       "subfield": {
         "id": "https://openalex.org/subfields/2208",
         "display_name": "Electrical and Electronic Engineering"
       },
       "field": {
         "id": "https://openalex.org/fields/22",
         "display_name": "Engineering"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     },
     {
       "id": "https://openalex.org/T10558",
       "display_name": "Nanoelectronics and Transistors",
       "value": 0.0017064,
       "subfield": {
         "id": "https://openalex.org/subfields/2208",
         "display_name": "Electrical and Electronic Engineering"
       },
       "field": {
         "id": "https://openalex.org/fields/22",
         "display_name": "Engineering"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     },
     {
       "id": "https://openalex.org/T13514",
       "display_name": "Experience-Based Knowledge Representation and Management",
       "value": 0.0014898,
       "subfield": {
         "id": "https://openalex.org/subfields/1702",
         "display_name": "Artificial Intelligence"
       },
       "field": {
         "id": "https://openalex.org/fields/17",
         "display_name": "Computer Science"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     },
     {
       "id": "https://openalex.org/T10472",
       "display_name": "Atomic Layer Deposition Technology",
       "value": 0.0014173,
       "subfield": {
         "id": "https://openalex.org/subfields/2208",
         "display_name": "Electrical and Electronic Engineering"
       },
       "field": {
         "id": "https://openalex.org/fields/22",
         "display_name": "Engineering"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     },
     {
       "id": "https://openalex.org/T12495",
       "display_name": "Electrostatic Discharge Protection in Integrated Circuits",
       "value": 0.0013585,
       "subfield": {
         "id": "https://openalex.org/subfields/2208",
         "display_name": "Electrical and Electronic Engineering"
       },
       "field": {
         "id": "https://openalex.org/fields/22",
         "display_name": "Engineering"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     },
     {
       "id": "https://openalex.org/T10460",
       "display_name": "Advances in Lead-free Soldering for Microelectronics",
       "value": 0.0010488,
       "subfield": {
         "id": "https://openalex.org/subfields/2208",
         "display_name": "Electrical and Electronic Engineering"
       },
       "field": {
         "id": "https://openalex.org/fields/22",
         "display_name": "Engineering"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     },
     {
       "id": "https://openalex.org/T11032",
       "display_name": "Very Large Scale Integration Testing",
       "value": 0.000945,
       "subfield": {
         "id": "https://openalex.org/subfields/1708",
         "display_name": "Hardware and Architecture"
       },
       "field": {
         "id": "https://openalex.org/fields/17",
         "display_name": "Computer Science"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     },
     {
       "id": "https://openalex.org/T12111",
       "display_name": "Fabric Defect Detection in Industrial Applications",
       "value": 0.0008976,
       "subfield": {
         "id": "https://openalex.org/subfields/2209",
         "display_name": "Industrial and Manufacturing Engineering"
       },
       "field": {
         "id": "https://openalex.org/fields/22",
         "display_name": "Engineering"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     },
     {
       "id": "https://openalex.org/T11301",
       "display_name": "Chemical Mechanical Polishing in Microelectronics Manufacturing",
       "value": 0.0007973,
       "subfield": {
         "id": "https://openalex.org/subfields/2204",
         "display_name": "Biomedical Engineering"
       },
       "field": {
         "id": "https://openalex.org/fields/22",
         "display_name": "Engineering"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     },
     {
       "id": "https://openalex.org/T10187",
       "display_name": "Radio Frequency Integrated Circuit Design",
       "value": 0.0007713,
       "subfield": {
         "id": "https://openalex.org/subfields/2208",
         "display_name": "Electrical and Electronic Engineering"
       },
       "field": {
         "id": "https://openalex.org/fields/22",
         "display_name": "Engineering"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     },
     {
       "id": "https://openalex.org/T12039",
       "display_name": "Surface Analysis and Electron Spectroscopy Techniques",
       "value": 0.0007575,
       "subfield": {
         "id": "https://openalex.org/subfields/2508",
         "display_name": "Surfaces, Coatings and Films"
       },
       "field": {
         "id": "https://openalex.org/fields/25",
         "display_name": "Materials Science"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     },
     {
       "id": "https://openalex.org/T11723",
       "display_name": "Antireflective Thin-Film Materials",
       "value": 0.0006443,
       "subfield": {
         "id": "https://openalex.org/subfields/2508",
         "display_name": "Surfaces, Coatings and Films"
       },
       "field": {
         "id": "https://openalex.org/fields/25",
         "display_name": "Materials Science"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     },
     {
       "id": "https://openalex.org/T11522",
       "display_name": "Design and Optimization of Field-Programmable Gate Arrays and Application-Specific Integrated Circuits",
       "value": 0.0006043,
       "subfield": {
         "id": "https://openalex.org/subfields/2208",
         "display_name": "Electrical and Electronic Engineering"
       },
       "field": {
         "id": "https://openalex.org/fields/22",
         "display_name": "Engineering"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     },
     {
       "id": "https://openalex.org/T11248",
       "display_name": "RF Power Amplifiers and Predistortion Techniques",
       "value": 0.000584,
       "subfield": {
         "id": "https://openalex.org/subfields/2208",
         "display_name": "Electrical and Electronic Engineering"
       },
       "field": {
         "id": "https://openalex.org/fields/22",
         "display_name": "Engineering"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     },
     {
       "id": "https://openalex.org/T12224",
       "display_name": "Nanoscale Lithographic Patterning Techniques",
       "value": 0.0005516,
       "subfield": {
         "id": "https://openalex.org/subfields/2204",
         "display_name": "Biomedical Engineering"
       },
       "field": {
         "id": "https://openalex.org/fields/22",
         "display_name": "Engineering"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     },
     {
       "id": "https://openalex.org/T11471",
       "display_name": "Self-Assembly of Block Copolymers in Nanotechnology",
       "value": 0.0004578,
       "subfield": {
         "id": "https://openalex.org/subfields/2505",
         "display_name": "Materials Chemistry"
       },
       "field": {
         "id": "https://openalex.org/fields/25",
         "display_name": "Materials Science"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     },
     {
       "id": "https://openalex.org/T10361",
       "display_name": "Power Electronics Technology",
       "value": 0.0004093,
       "subfield": {
         "id": "https://openalex.org/subfields/2208",
         "display_name": "Electrical and Electronic Engineering"
       },
       "field": {
         "id": "https://openalex.org/fields/22",
         "display_name": "Engineering"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     },
     {
       "id": "https://openalex.org/T11853",
       "display_name": "Physics and Chemistry of Schottky Barrier Height",
       "value": 0.0003703,
       "subfield": {
         "id": "https://openalex.org/subfields/3107",
         "display_name": "Atomic and Molecular Physics, and Optics"
       },
       "field": {
         "id": "https://openalex.org/fields/31",
         "display_name": "Physics and Astronomy"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     },
     {
       "id": "https://openalex.org/T10363",
       "display_name": "Low-Power VLSI Circuit Design and Optimization",
       "value": 0.0003703,
       "subfield": {
         "id": "https://openalex.org/subfields/2208",
         "display_name": "Electrical and Electronic Engineering"
       },
       "field": {
         "id": "https://openalex.org/fields/22",
         "display_name": "Engineering"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     },
     {
       "id": "https://openalex.org/T10502",
       "display_name": "Memristive Devices for Neuromorphic Computing",
       "value": 0.0003515,
       "subfield": {
         "id": "https://openalex.org/subfields/2208",
         "display_name": "Electrical and Electronic Engineering"
       },
       "field": {
         "id": "https://openalex.org/fields/22",
         "display_name": "Engineering"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     },
     {
       "id": "https://openalex.org/T11444",
       "display_name": "Electromagnetic Compatibility in Electronics",
       "value": 0.0003513,
       "subfield": {
         "id": "https://openalex.org/subfields/2208",
         "display_name": "Electrical and Electronic Engineering"
       },
       "field": {
         "id": "https://openalex.org/fields/22",
         "display_name": "Engineering"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     }
   ],
   "topics": [
     {
       "id": "https://openalex.org/T10472",
       "display_name": "Atomic Layer Deposition Technology",
       "count": 778,
       "subfield": {
         "id": "https://openalex.org/subfields/2208",
         "display_name": "Electrical and Electronic Engineering"
       },
       "field": {
         "id": "https://openalex.org/fields/22",
         "display_name": "Engineering"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     },
     {
       "id": "https://openalex.org/T14117",
       "display_name": "Failure Analysis of Integrated Circuits",
       "count": 700,
       "subfield": {
         "id": "https://openalex.org/subfields/2208",
         "display_name": "Electrical and Electronic Engineering"
       },
       "field": {
         "id": "https://openalex.org/fields/22",
         "display_name": "Engineering"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     },
     {
       "id": "https://openalex.org/T11338",
       "display_name": "Electron Beam Lithography: Resolution and Applications",
       "count": 549,
       "subfield": {
         "id": "https://openalex.org/subfields/2208",
         "display_name": "Electrical and Electronic Engineering"
       },
       "field": {
         "id": "https://openalex.org/fields/22",
         "display_name": "Engineering"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     },
     {
       "id": "https://openalex.org/T10558",
       "display_name": "Nanoelectronics and Transistors",
       "count": 464,
       "subfield": {
         "id": "https://openalex.org/subfields/2208",
         "display_name": "Electrical and Electronic Engineering"
       },
       "field": {
         "id": "https://openalex.org/fields/22",
         "display_name": "Engineering"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     },
     {
       "id": "https://openalex.org/T12039",
       "display_name": "Surface Analysis and Electron Spectroscopy Techniques",
       "count": 228,
       "subfield": {
         "id": "https://openalex.org/subfields/2508",
         "display_name": "Surfaces, Coatings and Films"
       },
       "field": {
         "id": "https://openalex.org/fields/25",
         "display_name": "Materials Science"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     },
     {
       "id": "https://openalex.org/T11301",
       "display_name": "Chemical Mechanical Polishing in Microelectronics Manufacturing",
       "count": 219,
       "subfield": {
         "id": "https://openalex.org/subfields/2204",
         "display_name": "Biomedical Engineering"
       },
       "field": {
         "id": "https://openalex.org/fields/22",
         "display_name": "Engineering"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     },
     {
       "id": "https://openalex.org/T11661",
       "display_name": "Low Dielectric Constant Materials for Microelectronics",
       "count": 216,
       "subfield": {
         "id": "https://openalex.org/subfields/2504",
         "display_name": "Electronic, Optical and Magnetic Materials"
       },
       "field": {
         "id": "https://openalex.org/fields/25",
         "display_name": "Materials Science"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     },
     {
       "id": "https://openalex.org/T11527",
       "display_name": "Three-Dimensional Integrated Circuits",
       "count": 197,
       "subfield": {
         "id": "https://openalex.org/subfields/2208",
         "display_name": "Electrical and Electronic Engineering"
       },
       "field": {
         "id": "https://openalex.org/fields/22",
         "display_name": "Engineering"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     },
     {
       "id": "https://openalex.org/T12111",
       "display_name": "Fabric Defect Detection in Industrial Applications",
       "count": 167,
       "subfield": {
         "id": "https://openalex.org/subfields/2209",
         "display_name": "Industrial and Manufacturing Engineering"
       },
       "field": {
         "id": "https://openalex.org/fields/22",
         "display_name": "Engineering"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     },
     {
       "id": "https://openalex.org/T10460",
       "display_name": "Advances in Lead-free Soldering for Microelectronics",
       "count": 126,
       "subfield": {
         "id": "https://openalex.org/subfields/2208",
         "display_name": "Electrical and Electronic Engineering"
       },
       "field": {
         "id": "https://openalex.org/fields/22",
         "display_name": "Engineering"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     },
     {
       "id": "https://openalex.org/T11032",
       "display_name": "Very Large Scale Integration Testing",
       "count": 125,
       "subfield": {
         "id": "https://openalex.org/subfields/1708",
         "display_name": "Hardware and Architecture"
       },
       "field": {
         "id": "https://openalex.org/fields/17",
         "display_name": "Computer Science"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     },
     {
       "id": "https://openalex.org/T10187",
       "display_name": "Radio Frequency Integrated Circuit Design",
       "count": 125,
       "subfield": {
         "id": "https://openalex.org/subfields/2208",
         "display_name": "Electrical and Electronic Engineering"
       },
       "field": {
         "id": "https://openalex.org/fields/22",
         "display_name": "Engineering"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     },
     {
       "id": "https://openalex.org/T12495",
       "display_name": "Electrostatic Discharge Protection in Integrated Circuits",
       "count": 108,
       "subfield": {
         "id": "https://openalex.org/subfields/2208",
         "display_name": "Electrical and Electronic Engineering"
       },
       "field": {
         "id": "https://openalex.org/fields/22",
         "display_name": "Engineering"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     },
     {
       "id": "https://openalex.org/T12808",
       "display_name": "Ferroelectric Devices for Low-Power Nanoscale Applications",
       "count": 106,
       "subfield": {
         "id": "https://openalex.org/subfields/2208",
         "display_name": "Electrical and Electronic Engineering"
       },
       "field": {
         "id": "https://openalex.org/fields/22",
         "display_name": "Engineering"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     },
     {
       "id": "https://openalex.org/T10299",
       "display_name": "Silicon Photonics Technology",
       "count": 105,
       "subfield": {
         "id": "https://openalex.org/subfields/2208",
         "display_name": "Electrical and Electronic Engineering"
       },
       "field": {
         "id": "https://openalex.org/fields/22",
         "display_name": "Engineering"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     },
     {
       "id": "https://openalex.org/T11853",
       "display_name": "Physics and Chemistry of Schottky Barrier Height",
       "count": 88,
       "subfield": {
         "id": "https://openalex.org/subfields/3107",
         "display_name": "Atomic and Molecular Physics, and Optics"
       },
       "field": {
         "id": "https://openalex.org/fields/31",
         "display_name": "Physics and Astronomy"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     },
     {
       "id": "https://openalex.org/T11723",
       "display_name": "Antireflective Thin-Film Materials",
       "count": 83,
       "subfield": {
         "id": "https://openalex.org/subfields/2508",
         "display_name": "Surfaces, Coatings and Films"
       },
       "field": {
         "id": "https://openalex.org/fields/25",
         "display_name": "Materials Science"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     },
     {
       "id": "https://openalex.org/T10502",
       "display_name": "Memristive Devices for Neuromorphic Computing",
       "count": 70,
       "subfield": {
         "id": "https://openalex.org/subfields/2208",
         "display_name": "Electrical and Electronic Engineering"
       },
       "field": {
         "id": "https://openalex.org/fields/22",
         "display_name": "Engineering"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     },
     {
       "id": "https://openalex.org/T10361",
       "display_name": "Power Electronics Technology",
       "count": 68,
       "subfield": {
         "id": "https://openalex.org/subfields/2208",
         "display_name": "Electrical and Electronic Engineering"
       },
       "field": {
         "id": "https://openalex.org/fields/22",
         "display_name": "Engineering"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     },
     {
       "id": "https://openalex.org/T11159",
       "display_name": "Design for Manufacture and Assembly in Manufacturing",
       "count": 58,
       "subfield": {
         "id": "https://openalex.org/subfields/2209",
         "display_name": "Industrial and Manufacturing Engineering"
       },
       "field": {
         "id": "https://openalex.org/fields/22",
         "display_name": "Engineering"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     },
     {
       "id": "https://openalex.org/T11522",
       "display_name": "Design and Optimization of Field-Programmable Gate Arrays and Application-Specific Integrated Circuits",
       "count": 50,
       "subfield": {
         "id": "https://openalex.org/subfields/2208",
         "display_name": "Electrical and Electronic Engineering"
       },
       "field": {
         "id": "https://openalex.org/fields/22",
         "display_name": "Engineering"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     },
     {
       "id": "https://openalex.org/T10363",
       "display_name": "Low-Power VLSI Circuit Design and Optimization",
       "count": 48,
       "subfield": {
         "id": "https://openalex.org/subfields/2208",
         "display_name": "Electrical and Electronic Engineering"
       },
       "field": {
         "id": "https://openalex.org/fields/22",
         "display_name": "Engineering"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     },
     {
       "id": "https://openalex.org/T10377",
       "display_name": "Mechanical Properties of Thin Film Coatings",
       "count": 47,
       "subfield": {
         "id": "https://openalex.org/subfields/2211",
         "display_name": "Mechanics of Materials"
       },
       "field": {
         "id": "https://openalex.org/fields/22",
         "display_name": "Engineering"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     },
     {
       "id": "https://openalex.org/T12224",
       "display_name": "Nanoscale Lithographic Patterning Techniques",
       "count": 45,
       "subfield": {
         "id": "https://openalex.org/subfields/2204",
         "display_name": "Biomedical Engineering"
       },
       "field": {
         "id": "https://openalex.org/fields/22",
         "display_name": "Engineering"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     },
     {
       "id": "https://openalex.org/T10624",
       "display_name": "Silicon Solar Cell Technology",
       "count": 44,
       "subfield": {
         "id": "https://openalex.org/subfields/2208",
         "display_name": "Electrical and Electronic Engineering"
       },
       "field": {
         "id": "https://openalex.org/fields/22",
         "display_name": "Engineering"
       },
       "domain": {
         "id": "https://openalex.org/domains/3",
         "display_name": "Physical Sciences"
       }
     }
   ],
   "type": "company",
   "type_id": "https://openalex.org/institution-types/company",
   "updated_date": "2024-09-04T12:03:24.069472",
   "works_api_url": "https://api.openalex.org/works?filter=institutions.id:I35662394",
   "works_count": 2387,
   "x_concepts": [
     {
       "id": "https://openalex.org/C121332964",
       "wikidata": "https://www.wikidata.org/wiki/Q413",
       "display_name": "Physics",
       "level": 0,
       "score": 92.5
     },
     {
       "id": "https://openalex.org/C127413603",
       "wikidata": "https://www.wikidata.org/wiki/Q11023",
       "display_name": "Engineering",
       "level": 0,
       "score": 89.3
     },
     {
       "id": "https://openalex.org/C192562407",
       "wikidata": "https://www.wikidata.org/wiki/Q228736",
       "display_name": "Materials science",
       "level": 0,
       "score": 86.3
     },
     {
       "id": "https://openalex.org/C41008148",
       "wikidata": "https://www.wikidata.org/wiki/Q21198",
       "display_name": "Computer science",
       "level": 0,
       "score": 78.0
     },
     {
       "id": "https://openalex.org/C49040817",
       "wikidata": "https://www.wikidata.org/wiki/Q193091",
       "display_name": "Optoelectronics",
       "level": 1,
       "score": 74.1
     },
     {
       "id": "https://openalex.org/C62520636",
       "wikidata": "https://www.wikidata.org/wiki/Q944",
       "display_name": "Quantum mechanics",
       "level": 1,
       "score": 73.9
     },
     {
       "id": "https://openalex.org/C119599485",
       "wikidata": "https://www.wikidata.org/wiki/Q43035",
       "display_name": "Electrical engineering",
       "level": 1,
       "score": 71.6
     },
     {
       "id": "https://openalex.org/C185592680",
       "wikidata": "https://www.wikidata.org/wiki/Q2329",
       "display_name": "Chemistry",
       "level": 0,
       "score": 58.9
     },
     {
       "id": "https://openalex.org/C171250308",
       "wikidata": "https://www.wikidata.org/wiki/Q11468",
       "display_name": "Nanotechnology",
       "level": 1,
       "score": 53.3
     },
     {
       "id": "https://openalex.org/C178790620",
       "wikidata": "https://www.wikidata.org/wiki/Q11351",
       "display_name": "Organic chemistry",
       "level": 1,
       "score": 51.4
     },
     {
       "id": "https://openalex.org/C159985019",
       "wikidata": "https://www.wikidata.org/wiki/Q181790",
       "display_name": "Composite material",
       "level": 1,
       "score": 46.2
     },
     {
       "id": "https://openalex.org/C24326235",
       "wikidata": "https://www.wikidata.org/wiki/Q126095",
       "display_name": "Electronic engineering",
       "level": 1,
       "score": 41.9
     },
     {
       "id": "https://openalex.org/C33923547",
       "wikidata": "https://www.wikidata.org/wiki/Q395",
       "display_name": "Mathematics",
       "level": 0,
       "score": 41.6
     },
     {
       "id": "https://openalex.org/C120665830",
       "wikidata": "https://www.wikidata.org/wiki/Q14620",
       "display_name": "Optics",
       "level": 1,
       "score": 40.6
     },
     {
       "id": "https://openalex.org/C111919701",
       "wikidata": "https://www.wikidata.org/wiki/Q9135",
       "display_name": "Operating system",
       "level": 1,
       "score": 38.5
     },
     {
       "id": "https://openalex.org/C191897082",
       "wikidata": "https://www.wikidata.org/wiki/Q11467",
       "display_name": "Metallurgy",
       "level": 1,
       "score": 34.4
     },
     {
       "id": "https://openalex.org/C76155785",
       "wikidata": "https://www.wikidata.org/wiki/Q418",
       "display_name": "Telecommunications",
       "level": 1,
       "score": 32.3
     },
     {
       "id": "https://openalex.org/C2779227376",
       "wikidata": "https://www.wikidata.org/wiki/Q6505497",
       "display_name": "Layer (electronics)",
       "level": 2,
       "score": 30.0
     },
     {
       "id": "https://openalex.org/C199360897",
       "wikidata": "https://www.wikidata.org/wiki/Q9143",
       "display_name": "Programming language",
       "level": 1,
       "score": 29.7
     },
     {
       "id": "https://openalex.org/C97355855",
       "wikidata": "https://www.wikidata.org/wiki/Q11473",
       "display_name": "Thermodynamics",
       "level": 1,
       "score": 29.1
     },
     {
       "id": "https://openalex.org/C165801399",
       "wikidata": "https://www.wikidata.org/wiki/Q25428",
       "display_name": "Voltage",
       "level": 2,
       "score": 27.2
     },
     {
       "id": "https://openalex.org/C86803240",
       "wikidata": "https://www.wikidata.org/wiki/Q420",
       "display_name": "Biology",
       "level": 0,
       "score": 22.4
     },
     {
       "id": "https://openalex.org/C160671074",
       "wikidata": "https://www.wikidata.org/wiki/Q267131",
       "display_name": "Wafer",
       "level": 2,
       "score": 20.6
     }
   ],
   "id": "https://openalex.org/I35662394"
 }

}