Item talk:Q334246
From geokb
{
"OpenAlex": {
"associated_institutions": [],
"cited_by_count": 7684,
"country_code": "IE",
"counts_by_year": [
{
"year": 2024,
"works_count": 3,
"cited_by_count": 128
},
{
"year": 2023,
"works_count": 8,
"cited_by_count": 237
},
{
"year": 2022,
"works_count": 9,
"cited_by_count": 268
},
{
"year": 2021,
"works_count": 6,
"cited_by_count": 245
},
{
"year": 2020,
"works_count": 6,
"cited_by_count": 237
},
{
"year": 2019,
"works_count": 4,
"cited_by_count": 208
},
{
"year": 2018,
"works_count": 2,
"cited_by_count": 271
},
{
"year": 2017,
"works_count": 1,
"cited_by_count": 270
},
{
"year": 2016,
"works_count": 1,
"cited_by_count": 300
},
{
"year": 2015,
"works_count": 7,
"cited_by_count": 333
},
{
"year": 2014,
"works_count": 9,
"cited_by_count": 301
},
{
"year": 2013,
"works_count": 8,
"cited_by_count": 316
},
{
"year": 2012,
"works_count": 1,
"cited_by_count": 320
}
],
"created_date": "2022-02-02",
"display_name": "National Microelectronics Applications Centre (Ireland)",
"display_name_acronyms": [],
"display_name_alternatives": [],
"geo": {
"city": "Limerick",
"geonames_city_id": "2962943",
"region": null,
"country_code": "IE",
"country": "Ireland",
"latitude": 52.667736,
"longitude": -8.634949
},
"homepage_url": "http://mac.ie/",
"ids": {
"openalex": "https://openalex.org/I4210099932",
"ror": "https://ror.org/012k6p920",
"grid": "grid.438421.8"
},
"image_thumbnail_url": null,
"image_url": null,
"international": {
"display_name": {
"en": "National Microelectronics Applications Centre (Ireland)"
}
},
"is_super_system": false,
"lineage": [
"https://openalex.org/I4210099932"
],
"repositories": [],
"roles": [
{
"role": "institution",
"id": "https://openalex.org/I4210099932",
"works_count": 596
}
],
"ror": "https://ror.org/012k6p920",
"summary_stats": {
"2yr_mean_citedness": 3.3333333333333335,
"h_index": 42,
"i10_index": 172
},
"topic_share": [
{
"id": "https://openalex.org/T10460",
"display_name": "Advances in Lead-free Soldering for Microelectronics",
"value": 0.0004328,
"subfield": {
"id": "https://openalex.org/subfields/2208",
"display_name": "Electrical and Electronic Engineering"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T14117",
"display_name": "Failure Analysis of Integrated Circuits",
"value": 0.0003521,
"subfield": {
"id": "https://openalex.org/subfields/2208",
"display_name": "Electrical and Electronic Engineering"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T10558",
"display_name": "Nanoelectronics and Transistors",
"value": 0.0003383,
"subfield": {
"id": "https://openalex.org/subfields/2208",
"display_name": "Electrical and Electronic Engineering"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T11527",
"display_name": "Three-Dimensional Integrated Circuits",
"value": 0.0002941,
"subfield": {
"id": "https://openalex.org/subfields/2208",
"display_name": "Electrical and Electronic Engineering"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T11005",
"display_name": "Fault Tolerance in Electronic Systems",
"value": 0.0002717,
"subfield": {
"id": "https://openalex.org/subfields/2208",
"display_name": "Electrical and Electronic Engineering"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T10472",
"display_name": "Atomic Layer Deposition Technology",
"value": 0.0002678,
"subfield": {
"id": "https://openalex.org/subfields/2208",
"display_name": "Electrical and Electronic Engineering"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T10361",
"display_name": "Power Electronics Technology",
"value": 0.0002649,
"subfield": {
"id": "https://openalex.org/subfields/2208",
"display_name": "Electrical and Electronic Engineering"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T11417",
"display_name": "Phase-Locked Loops in High-Speed Circuits",
"value": 0.0002522,
"subfield": {
"id": "https://openalex.org/subfields/2208",
"display_name": "Electrical and Electronic Engineering"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T10323",
"display_name": "Analog Circuit Design for Biomedical Applications",
"value": 0.0002406,
"subfield": {
"id": "https://openalex.org/subfields/2204",
"display_name": "Biomedical Engineering"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T11661",
"display_name": "Low Dielectric Constant Materials for Microelectronics",
"value": 0.0002143,
"subfield": {
"id": "https://openalex.org/subfields/2504",
"display_name": "Electronic, Optical and Magnetic Materials"
},
"field": {
"id": "https://openalex.org/fields/25",
"display_name": "Materials Science"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T12495",
"display_name": "Electrostatic Discharge Protection in Integrated Circuits",
"value": 0.0001887,
"subfield": {
"id": "https://openalex.org/subfields/2208",
"display_name": "Electrical and Electronic Engineering"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T13251",
"display_name": "Negative Temperature Coefficient Resistance (NTCR) Ceramic Thermistors",
"value": 0.0001876,
"subfield": {
"id": "https://openalex.org/subfields/2208",
"display_name": "Electrical and Electronic Engineering"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T11200",
"display_name": "Electrodeposition and Composite Coatings",
"value": 0.000185,
"subfield": {
"id": "https://openalex.org/subfields/2208",
"display_name": "Electrical and Electronic Engineering"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T10623",
"display_name": "Plasmonics for Photovoltaic Devices",
"value": 0.0001837,
"subfield": {
"id": "https://openalex.org/subfields/2208",
"display_name": "Electrical and Electronic Engineering"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T12153",
"display_name": "Time-of-Flight Imaging Techniques",
"value": 0.0001796,
"subfield": {
"id": "https://openalex.org/subfields/3105",
"display_name": "Instrumentation"
},
"field": {
"id": "https://openalex.org/fields/31",
"display_name": "Physics and Astronomy"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T10624",
"display_name": "Silicon Solar Cell Technology",
"value": 0.0001792,
"subfield": {
"id": "https://openalex.org/subfields/2208",
"display_name": "Electrical and Electronic Engineering"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T10187",
"display_name": "Radio Frequency Integrated Circuit Design",
"value": 0.0001789,
"subfield": {
"id": "https://openalex.org/subfields/2208",
"display_name": "Electrical and Electronic Engineering"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T10363",
"display_name": "Low-Power VLSI Circuit Design and Optimization",
"value": 0.000162,
"subfield": {
"id": "https://openalex.org/subfields/2208",
"display_name": "Electrical and Electronic Engineering"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T10369",
"display_name": "Microelectromechanical Systems",
"value": 0.0001611,
"subfield": {
"id": "https://openalex.org/subfields/2208",
"display_name": "Electrical and Electronic Engineering"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T11169",
"display_name": "Porous Silicon Nanoparticles and Nanostructures",
"value": 0.0001518,
"subfield": {
"id": "https://openalex.org/subfields/2505",
"display_name": "Materials Chemistry"
},
"field": {
"id": "https://openalex.org/fields/25",
"display_name": "Materials Science"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T11032",
"display_name": "Very Large Scale Integration Testing",
"value": 0.0001512,
"subfield": {
"id": "https://openalex.org/subfields/1708",
"display_name": "Hardware and Architecture"
},
"field": {
"id": "https://openalex.org/fields/17",
"display_name": "Computer Science"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T11992",
"display_name": "CMOS Image Sensor Technology",
"value": 0.0001477,
"subfield": {
"id": "https://openalex.org/subfields/2208",
"display_name": "Electrical and Electronic Engineering"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T11444",
"display_name": "Electromagnetic Compatibility in Electronics",
"value": 0.0001307,
"subfield": {
"id": "https://openalex.org/subfields/2208",
"display_name": "Electrical and Electronic Engineering"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T11853",
"display_name": "Physics and Chemistry of Schottky Barrier Height",
"value": 0.0001262,
"subfield": {
"id": "https://openalex.org/subfields/3107",
"display_name": "Atomic and Molecular Physics, and Optics"
},
"field": {
"id": "https://openalex.org/fields/31",
"display_name": "Physics and Astronomy"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T11230",
"display_name": "Vibration Energy Harvesting for Microsystems Applications",
"value": 0.0001198,
"subfield": {
"id": "https://openalex.org/subfields/2210",
"display_name": "Mechanical Engineering"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
}
],
"topics": [
{
"id": "https://openalex.org/T10472",
"display_name": "Atomic Layer Deposition Technology",
"count": 147,
"subfield": {
"id": "https://openalex.org/subfields/2208",
"display_name": "Electrical and Electronic Engineering"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T10558",
"display_name": "Nanoelectronics and Transistors",
"count": 92,
"subfield": {
"id": "https://openalex.org/subfields/2208",
"display_name": "Electrical and Electronic Engineering"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T14117",
"display_name": "Failure Analysis of Integrated Circuits",
"count": 79,
"subfield": {
"id": "https://openalex.org/subfields/2208",
"display_name": "Electrical and Electronic Engineering"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T10460",
"display_name": "Advances in Lead-free Soldering for Microelectronics",
"count": 52,
"subfield": {
"id": "https://openalex.org/subfields/2208",
"display_name": "Electrical and Electronic Engineering"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T10299",
"display_name": "Silicon Photonics Technology",
"count": 47,
"subfield": {
"id": "https://openalex.org/subfields/2208",
"display_name": "Electrical and Electronic Engineering"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T10361",
"display_name": "Power Electronics Technology",
"count": 44,
"subfield": {
"id": "https://openalex.org/subfields/2208",
"display_name": "Electrical and Electronic Engineering"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T11429",
"display_name": "Optical Interconnect Technologies",
"count": 41,
"subfield": {
"id": "https://openalex.org/subfields/2208",
"display_name": "Electrical and Electronic Engineering"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T10022",
"display_name": "Quantum Dot Devices and Semiconductors",
"count": 37,
"subfield": {
"id": "https://openalex.org/subfields/3107",
"display_name": "Atomic and Molecular Physics, and Optics"
},
"field": {
"id": "https://openalex.org/fields/31",
"display_name": "Physics and Astronomy"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T10323",
"display_name": "Analog Circuit Design for Biomedical Applications",
"count": 35,
"subfield": {
"id": "https://openalex.org/subfields/2204",
"display_name": "Biomedical Engineering"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T11472",
"display_name": "Advances in Chemical Sensor Technologies",
"count": 34,
"subfield": {
"id": "https://openalex.org/subfields/1502",
"display_name": "Bioengineering"
},
"field": {
"id": "https://openalex.org/fields/15",
"display_name": "Chemical Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T10624",
"display_name": "Silicon Solar Cell Technology",
"count": 33,
"subfield": {
"id": "https://openalex.org/subfields/2208",
"display_name": "Electrical and Electronic Engineering"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T10623",
"display_name": "Plasmonics for Photovoltaic Devices",
"count": 32,
"subfield": {
"id": "https://openalex.org/subfields/2208",
"display_name": "Electrical and Electronic Engineering"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T11853",
"display_name": "Physics and Chemistry of Schottky Barrier Height",
"count": 30,
"subfield": {
"id": "https://openalex.org/subfields/3107",
"display_name": "Atomic and Molecular Physics, and Optics"
},
"field": {
"id": "https://openalex.org/fields/31",
"display_name": "Physics and Astronomy"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T11527",
"display_name": "Three-Dimensional Integrated Circuits",
"count": 29,
"subfield": {
"id": "https://openalex.org/subfields/2208",
"display_name": "Electrical and Electronic Engineering"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T10187",
"display_name": "Radio Frequency Integrated Circuit Design",
"count": 29,
"subfield": {
"id": "https://openalex.org/subfields/2208",
"display_name": "Electrical and Electronic Engineering"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T11005",
"display_name": "Fault Tolerance in Electronic Systems",
"count": 25,
"subfield": {
"id": "https://openalex.org/subfields/2208",
"display_name": "Electrical and Electronic Engineering"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T10369",
"display_name": "Microelectromechanical Systems",
"count": 25,
"subfield": {
"id": "https://openalex.org/subfields/2208",
"display_name": "Electrical and Electronic Engineering"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T11661",
"display_name": "Low Dielectric Constant Materials for Microelectronics",
"count": 24,
"subfield": {
"id": "https://openalex.org/subfields/2504",
"display_name": "Electronic, Optical and Magnetic Materials"
},
"field": {
"id": "https://openalex.org/fields/25",
"display_name": "Materials Science"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T11417",
"display_name": "Phase-Locked Loops in High-Speed Circuits",
"count": 22,
"subfield": {
"id": "https://openalex.org/subfields/2208",
"display_name": "Electrical and Electronic Engineering"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T11160",
"display_name": "Acoustic Wave Biosensors and Thin Film Resonators",
"count": 22,
"subfield": {
"id": "https://openalex.org/subfields/2204",
"display_name": "Biomedical Engineering"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T10363",
"display_name": "Low-Power VLSI Circuit Design and Optimization",
"count": 21,
"subfield": {
"id": "https://openalex.org/subfields/2208",
"display_name": "Electrical and Electronic Engineering"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T11169",
"display_name": "Porous Silicon Nanoparticles and Nanostructures",
"count": 20,
"subfield": {
"id": "https://openalex.org/subfields/2505",
"display_name": "Materials Chemistry"
},
"field": {
"id": "https://openalex.org/fields/25",
"display_name": "Materials Science"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T11032",
"display_name": "Very Large Scale Integration Testing",
"count": 20,
"subfield": {
"id": "https://openalex.org/subfields/1708",
"display_name": "Hardware and Architecture"
},
"field": {
"id": "https://openalex.org/fields/17",
"display_name": "Computer Science"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T10412",
"display_name": "Origins and Future of Microfluidics",
"count": 19,
"subfield": {
"id": "https://openalex.org/subfields/2204",
"display_name": "Biomedical Engineering"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T12153",
"display_name": "Time-of-Flight Imaging Techniques",
"count": 17,
"subfield": {
"id": "https://openalex.org/subfields/3105",
"display_name": "Instrumentation"
},
"field": {
"id": "https://openalex.org/fields/31",
"display_name": "Physics and Astronomy"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
}
],
"type": "company",
"type_id": "https://openalex.org/institution-types/company",
"updated_date": "2024-09-05T20:23:10.177987",
"works_api_url": "https://api.openalex.org/works?filter=institutions.id:I4210099932",
"works_count": 596,
"x_concepts": [
{
"id": "https://openalex.org/C121332964",
"wikidata": "https://www.wikidata.org/wiki/Q413",
"display_name": "Physics",
"level": 0,
"score": 93.3
},
{
"id": "https://openalex.org/C127413603",
"wikidata": "https://www.wikidata.org/wiki/Q11023",
"display_name": "Engineering",
"level": 0,
"score": 85.9
},
{
"id": "https://openalex.org/C192562407",
"wikidata": "https://www.wikidata.org/wiki/Q228736",
"display_name": "Materials science",
"level": 0,
"score": 84.6
},
{
"id": "https://openalex.org/C62520636",
"wikidata": "https://www.wikidata.org/wiki/Q944",
"display_name": "Quantum mechanics",
"level": 1,
"score": 83.1
},
{
"id": "https://openalex.org/C119599485",
"wikidata": "https://www.wikidata.org/wiki/Q43035",
"display_name": "Electrical engineering",
"level": 1,
"score": 68.3
},
{
"id": "https://openalex.org/C49040817",
"wikidata": "https://www.wikidata.org/wiki/Q193091",
"display_name": "Optoelectronics",
"level": 1,
"score": 64.6
},
{
"id": "https://openalex.org/C41008148",
"wikidata": "https://www.wikidata.org/wiki/Q21198",
"display_name": "Computer science",
"level": 0,
"score": 59.7
},
{
"id": "https://openalex.org/C185592680",
"wikidata": "https://www.wikidata.org/wiki/Q2329",
"display_name": "Chemistry",
"level": 0,
"score": 57.0
},
{
"id": "https://openalex.org/C178790620",
"wikidata": "https://www.wikidata.org/wiki/Q11351",
"display_name": "Organic chemistry",
"level": 1,
"score": 50.0
},
{
"id": "https://openalex.org/C120665830",
"wikidata": "https://www.wikidata.org/wiki/Q14620",
"display_name": "Optics",
"level": 1,
"score": 44.5
},
{
"id": "https://openalex.org/C159985019",
"wikidata": "https://www.wikidata.org/wiki/Q181790",
"display_name": "Composite material",
"level": 1,
"score": 40.1
},
{
"id": "https://openalex.org/C171250308",
"wikidata": "https://www.wikidata.org/wiki/Q11468",
"display_name": "Nanotechnology",
"level": 1,
"score": 38.8
},
{
"id": "https://openalex.org/C97355855",
"wikidata": "https://www.wikidata.org/wiki/Q11473",
"display_name": "Thermodynamics",
"level": 1,
"score": 37.1
},
{
"id": "https://openalex.org/C191897082",
"wikidata": "https://www.wikidata.org/wiki/Q11467",
"display_name": "Metallurgy",
"level": 1,
"score": 35.1
},
{
"id": "https://openalex.org/C24326235",
"wikidata": "https://www.wikidata.org/wiki/Q126095",
"display_name": "Electronic engineering",
"level": 1,
"score": 34.7
},
{
"id": "https://openalex.org/C86803240",
"wikidata": "https://www.wikidata.org/wiki/Q420",
"display_name": "Biology",
"level": 0,
"score": 32.2
},
{
"id": "https://openalex.org/C33923547",
"wikidata": "https://www.wikidata.org/wiki/Q395",
"display_name": "Mathematics",
"level": 0,
"score": 27.9
},
{
"id": "https://openalex.org/C76155785",
"wikidata": "https://www.wikidata.org/wiki/Q418",
"display_name": "Telecommunications",
"level": 1,
"score": 27.2
},
{
"id": "https://openalex.org/C165801399",
"wikidata": "https://www.wikidata.org/wiki/Q25428",
"display_name": "Voltage",
"level": 2,
"score": 25.5
},
{
"id": "https://openalex.org/C111919701",
"wikidata": "https://www.wikidata.org/wiki/Q9135",
"display_name": "Operating system",
"level": 1,
"score": 22.5
}
],
"id": "https://openalex.org/I4210099932"
}
}
