Item talk:Q168640

{

 "OpenAlex": {
   "display_name": "Characterization of Surface Roughness in Optical Components",
   "description": "This cluster of papers focuses on the characterization and measurement of surface roughness in optical components, utilizing techniques such as fractal analysis, machine vision, scattering theory, and thin film analysis. The research covers topics such as surface roughness measurement, power spectral density analysis, micromorphology characterization, and the application of image processing for evaluating surface roughness.",
   "keywords": [
     "Surface Characterization",
     "Roughness Measurement",
     "Optical Components",
     "Fractal Analysis",
     "Machine Vision",
     "Scattering Theory",
     "Thin Film Analysis",
     "Micromorphology",
     "Power Spectral Density",
     "Image Processing"
   ],
   "ids": {
     "openalex": "https://openalex.org/T13049",
     "wikipedia": "https://en.wikipedia.org/wiki/Surface_roughness"
   },
   "subfield": {
     "id": "https://openalex.org/subfields/2206",
     "display_name": "Computational Mechanics"
   },
   "field": {
     "id": "https://openalex.org/fields/22",
     "display_name": "Engineering"
   },
   "domain": {
     "id": "https://openalex.org/domains/3",
     "display_name": "Physical Sciences"
   },
   "updated_date": "2024-08-12T05:37:04.505353",
   "created_date": "2024-01-23",
   "type": "topic",
   "oa_id": "T13049",
   "id": "https://openalex.org/T13049"
 }

}