Item talk:Q168190

{

 "OpenAlex": {
   "display_name": "Surface Analysis and Electron Spectroscopy Techniques",
   "description": "This cluster of papers focuses on surface analysis and electron spectroscopy techniques, including X-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM), electron inelastic mean free paths, ambient pressure photoelectron spectroscopy, and applications in surface science and nanomaterials characterization. It covers topics such as quantitative surface analysis, secondary electron emission, environmental scanning electron microscopy, and hard X-ray photoemission spectroscopy.",
   "keywords": [
     "X-ray Photoelectron Spectroscopy",
     "Scanning Electron Microscopy",
     "Electron Inelastic Mean Free Paths",
     "Ambient Pressure Photoelectron Spectroscopy",
     "Surface Science",
     "Quantitative Surface Analysis",
     "Secondary Electron Emission",
     "Nanomaterials Characterization",
     "Environmental Scanning Electron Microscopy",
     "Hard X-ray Photoemission Spectroscopy"
   ],
   "ids": {
     "openalex": "https://openalex.org/T12039",
     "wikipedia": "https://en.wikipedia.org/wiki/Surface_analysis"
   },
   "subfield": {
     "id": "https://openalex.org/subfields/2508",
     "display_name": "Surfaces, Coatings and Films"
   },
   "field": {
     "id": "https://openalex.org/fields/25",
     "display_name": "Materials Science"
   },
   "domain": {
     "id": "https://openalex.org/domains/3",
     "display_name": "Physical Sciences"
   },
   "updated_date": "2024-08-12T05:36:22.863571",
   "created_date": "2024-01-23",
   "type": "topic",
   "oa_id": "T12039",
   "id": "https://openalex.org/T12039"
 }

}