Item talk:Q168165

{

 "OpenAlex": {
   "display_name": "Failure Analysis of Integrated Circuits",
   "description": "This cluster of papers focuses on advanced techniques and methodologies for failure analysis of integrated circuits. It covers a wide range of topics including photon emission microscopy, laser voltage probing, backside analysis, nanoprobing, fault localization, time-resolved imaging, and electrical characterization. The papers explore innovative approaches to identify and analyze failures in CMOS circuits and other semiconductor devices.",
   "keywords": [
     "Failure Analysis",
     "Integrated Circuits",
     "Photon Emission Microscopy",
     "Laser Voltage Probing",
     "Backside Analysis",
     "Nanoprobing",
     "CMOS Circuits",
     "Fault Localization",
     "Time-Resolved Imaging",
     "Electrical Characterization"
   ],
   "ids": {
     "openalex": "https://openalex.org/T14117",
     "wikipedia": "https://en.wikipedia.org/wiki/Failure_analysis"
   },
   "subfield": {
     "id": "https://openalex.org/subfields/2208",
     "display_name": "Electrical and Electronic Engineering"
   },
   "field": {
     "id": "https://openalex.org/fields/22",
     "display_name": "Engineering"
   },
   "domain": {
     "id": "https://openalex.org/domains/3",
     "display_name": "Physical Sciences"
   },
   "updated_date": "2024-08-12T05:54:31.285999",
   "created_date": "2024-01-23",
   "type": "topic",
   "oa_id": "T14117",
   "id": "https://openalex.org/T14117"
 }

}