Item talk:Q142408
From geokb
{
"OpenAlex": {
"id": "https://openalex.org/A5011153385",
"orcid": "https://orcid.org/0000-0003-0707-8954",
"display_name": "Yoshio Takahashi",
"display_name_alternatives": [
"Yoshio Takahashi Yoshio Takahashi",
"Yoshio Takahashi",
"Y. Takahashi"
],
"works_count": 373,
"cited_by_count": 2004,
"summary_stats": {
"2yr_mean_citedness": 1.3703703703703705,
"h_index": 20,
"i10_index": 55
},
"ids": {
"openalex": "https://openalex.org/A5011153385",
"orcid": "https://orcid.org/0000-0003-0707-8954"
},
"affiliations": [
{
"institution": {
"id": "https://openalex.org/I65143321",
"ror": "https://ror.org/02exqgm79",
"display_name": "Hitachi (Japan)",
"country_code": "JP",
"type": "company",
"lineage": [
"https://openalex.org/I65143321"
]
},
"years": [
2024,
2023,
2022,
2021,
2020,
2019,
2018,
2017,
2016,
2015
]
},
{
"institution": {
"id": "https://openalex.org/I74801974",
"ror": "https://ror.org/057zh3y96",
"display_name": "The University of Tokyo",
"country_code": "JP",
"type": "education",
"lineage": [
"https://openalex.org/I74801974"
]
},
"years": [
2024,
2023,
2022,
2021,
2013,
1996,
1995
]
},
{
"institution": {
"id": "https://openalex.org/I1302918504",
"ror": "https://ror.org/05vvg9554",
"display_name": "Planetary Science Institute",
"country_code": "US",
"type": "nonprofit",
"lineage": [
"https://openalex.org/I1302918504"
]
},
"years": [
2023
]
},
{
"institution": {
"id": "https://openalex.org/I317356780",
"ror": "https://ror.org/02skfsw40",
"display_name": "Osaka City University",
"country_code": "JP",
"type": "education",
"lineage": [
"https://openalex.org/I317356780"
]
},
"years": [
2021
]
},
{
"institution": {
"id": "https://openalex.org/I880766802",
"ror": "https://ror.org/04n835f38",
"display_name": "Graduate School USA",
"country_code": "US",
"type": "education",
"lineage": [
"https://openalex.org/I880766802"
]
},
"years": [
2019
]
},
{
"institution": {
"id": "https://openalex.org/I4210097697",
"ror": "https://ror.org/01006t419",
"display_name": "Corrected Electron Optical Systems (Germany)",
"country_code": "DE",
"type": "company",
"lineage": [
"https://openalex.org/I4210097697"
]
},
"years": [
2015
]
},
{
"institution": {
"id": "https://openalex.org/I4210132156",
"ror": "https://ror.org/03gv2xk61",
"display_name": "RIKEN Center for Emergent Matter Science",
"country_code": "JP",
"type": "facility",
"lineage": [
"https://openalex.org/I4210110652",
"https://openalex.org/I4210132156"
]
},
"years": [
2015
]
},
{
"institution": {
"id": "https://openalex.org/I178574317",
"ror": "https://ror.org/01529vy56",
"display_name": "Mie University",
"country_code": "JP",
"type": "education",
"lineage": [
"https://openalex.org/I178574317"
]
},
"years": [
2012,
2009,
2007,
2000
]
},
{
"institution": {
"id": "https://openalex.org/I98285908",
"ror": "https://ror.org/035t8zc32",
"display_name": "Osaka University",
"country_code": "JP",
"type": "education",
"lineage": [
"https://openalex.org/I98285908"
]
},
"years": [
2011,
1990
]
},
{
"institution": {
"id": "https://openalex.org/I112524849",
"ror": "https://ror.org/00xy44n04",
"display_name": "Yamagata University",
"country_code": "JP",
"type": "education",
"lineage": [
"https://openalex.org/I112524849"
]
},
"years": [
2007,
2006,
2005,
2004,
2003,
1994,
1991,
1990,
1981,
1967
]
}
],
"last_known_institutions": [
{
"id": "https://openalex.org/I74801974",
"ror": "https://ror.org/057zh3y96",
"display_name": "The University of Tokyo",
"country_code": "JP",
"type": "education",
"lineage": [
"https://openalex.org/I74801974"
]
}
],
"topics": [
{
"id": "https://openalex.org/T10049",
"display_name": "Magnetic Skyrmions and Spintronics",
"count": 52,
"subfield": {
"id": "https://openalex.org/subfields/3107",
"display_name": "Atomic and Molecular Physics, and Optics"
},
"field": {
"id": "https://openalex.org/fields/31",
"display_name": "Physics and Astronomy"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T10857",
"display_name": "Cryo-Electron Microscopy Techniques",
"count": 38,
"subfield": {
"id": "https://openalex.org/subfields/1315",
"display_name": "Structural Biology"
},
"field": {
"id": "https://openalex.org/fields/13",
"display_name": "Biochemistry, Genetics and Molecular Biology"
},
"domain": {
"id": "https://openalex.org/domains/1",
"display_name": "Life Sciences"
}
},
{
"id": "https://openalex.org/T12039",
"display_name": "Surface Analysis and Electron Spectroscopy Techniques",
"count": 33,
"subfield": {
"id": "https://openalex.org/subfields/2508",
"display_name": "Surfaces, Coatings and Films"
},
"field": {
"id": "https://openalex.org/fields/25",
"display_name": "Materials Science"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T11222",
"display_name": "Magnetostriction in Magnetic Materials",
"count": 20,
"subfield": {
"id": "https://openalex.org/subfields/2504",
"display_name": "Electronic, Optical and Magnetic Materials"
},
"field": {
"id": "https://openalex.org/fields/25",
"display_name": "Materials Science"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T11740",
"display_name": "Geochemistry of Manganese Oxides in Sedimentary Environments",
"count": 18,
"subfield": {
"id": "https://openalex.org/subfields/1906",
"display_name": "Geochemistry and Petrology"
},
"field": {
"id": "https://openalex.org/fields/19",
"display_name": "Earth and Planetary Sciences"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T11372",
"display_name": "Hydraulic Systems Control and Optimization",
"count": 18,
"subfield": {
"id": "https://openalex.org/subfields/2210",
"display_name": "Mechanical Engineering"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T10973",
"display_name": "Chemistry of Actinide and Lanthanide Elements",
"count": 18,
"subfield": {
"id": "https://openalex.org/subfields/1604",
"display_name": "Inorganic Chemistry"
},
"field": {
"id": "https://openalex.org/fields/16",
"display_name": "Chemistry"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T10399",
"display_name": "Characterization of Shale Gas Pore Structure",
"count": 15,
"subfield": {
"id": "https://openalex.org/subfields/2211",
"display_name": "Mechanics of Materials"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T13619",
"display_name": "Rock Mechanics and Wave Propagation in Geomedia",
"count": 14,
"subfield": {
"id": "https://openalex.org/subfields/2211",
"display_name": "Mechanics of Materials"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T12358",
"display_name": "Kinetic Analysis of Thermal Processes in Materials",
"count": 12,
"subfield": {
"id": "https://openalex.org/subfields/2505",
"display_name": "Materials Chemistry"
},
"field": {
"id": "https://openalex.org/fields/25",
"display_name": "Materials Science"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T11799",
"display_name": "Mechanics of Gecko Foot Adhesion",
"count": 11,
"subfield": {
"id": "https://openalex.org/subfields/2211",
"display_name": "Mechanics of Materials"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T13200",
"display_name": "Cryogenic Fluid Storage and Management",
"count": 11,
"subfield": {
"id": "https://openalex.org/subfields/2202",
"display_name": "Aerospace Engineering"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T10995",
"display_name": "Anaerobic Methane Oxidation and Gas Hydrates",
"count": 11,
"subfield": {
"id": "https://openalex.org/subfields/2304",
"display_name": "Environmental Chemistry"
},
"field": {
"id": "https://openalex.org/fields/23",
"display_name": "Environmental Science"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T10938",
"display_name": "Thermal Energy Storage with Phase Change Materials",
"count": 10,
"subfield": {
"id": "https://openalex.org/subfields/2210",
"display_name": "Mechanical Engineering"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T10923",
"display_name": "Atomic Force Microscopy Techniques",
"count": 10,
"subfield": {
"id": "https://openalex.org/subfields/3107",
"display_name": "Atomic and Molecular Physics, and Optics"
},
"field": {
"id": "https://openalex.org/fields/31",
"display_name": "Physics and Astronomy"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T10892",
"display_name": "Drilling Fluid Technology and Well Integrity",
"count": 10,
"subfield": {
"id": "https://openalex.org/subfields/2212",
"display_name": "Ocean Engineering"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T13193",
"display_name": "Geological Evolution of the Arctic Region",
"count": 10,
"subfield": {
"id": "https://openalex.org/subfields/1907",
"display_name": "Geology"
},
"field": {
"id": "https://openalex.org/fields/19",
"display_name": "Earth and Planetary Sciences"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T12157",
"display_name": "Machine Learning for Mineral Prospectivity Mapping",
"count": 10,
"subfield": {
"id": "https://openalex.org/subfields/1702",
"display_name": "Artificial Intelligence"
},
"field": {
"id": "https://openalex.org/fields/17",
"display_name": "Computer Science"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T11089",
"display_name": "Environmental Impacts of Fukushima Nuclear Disaster",
"count": 9,
"subfield": {
"id": "https://openalex.org/subfields/2306",
"display_name": "Global and Planetary Change"
},
"field": {
"id": "https://openalex.org/fields/23",
"display_name": "Environmental Science"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T11786",
"display_name": "Magnetosome Formation in Prokaryotes",
"count": 9,
"subfield": {
"id": "https://openalex.org/subfields/1312",
"display_name": "Molecular Biology"
},
"field": {
"id": "https://openalex.org/fields/13",
"display_name": "Biochemistry, Genetics and Molecular Biology"
},
"domain": {
"id": "https://openalex.org/domains/1",
"display_name": "Life Sciences"
}
},
{
"id": "https://openalex.org/T14128",
"display_name": "Materials Science and Engineering and Thermodynamics",
"count": 8,
"subfield": {
"id": "https://openalex.org/subfields/2500",
"display_name": "General Materials Science"
},
"field": {
"id": "https://openalex.org/fields/25",
"display_name": "Materials Science"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T12976",
"display_name": "Influence of Magnetic Fields on Biological Systems",
"count": 8,
"subfield": {
"id": "https://openalex.org/subfields/1314",
"display_name": "Physiology"
},
"field": {
"id": "https://openalex.org/fields/13",
"display_name": "Biochemistry, Genetics and Molecular Biology"
},
"domain": {
"id": "https://openalex.org/domains/1",
"display_name": "Life Sciences"
}
},
{
"id": "https://openalex.org/T10382",
"display_name": "Semiconductor Spintronics and Quantum Computing",
"count": 8,
"subfield": {
"id": "https://openalex.org/subfields/3107",
"display_name": "Atomic and Molecular Physics, and Optics"
},
"field": {
"id": "https://openalex.org/fields/31",
"display_name": "Physics and Astronomy"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T10001",
"display_name": "Tectonic and Geochronological Evolution of Orogens",
"count": 8,
"subfield": {
"id": "https://openalex.org/subfields/1908",
"display_name": "Geophysics"
},
"field": {
"id": "https://openalex.org/fields/19",
"display_name": "Earth and Planetary Sciences"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T11183",
"display_name": "X-ray Imaging Techniques and Applications",
"count": 7,
"subfield": {
"id": "https://openalex.org/subfields/3108",
"display_name": "Radiation"
},
"field": {
"id": "https://openalex.org/fields/31",
"display_name": "Physics and Astronomy"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
}
],
"topic_share": [
{
"id": "https://openalex.org/T10857",
"display_name": "Cryo-Electron Microscopy Techniques",
"value": 0.0004669,
"subfield": {
"id": "https://openalex.org/subfields/1315",
"display_name": "Structural Biology"
},
"field": {
"id": "https://openalex.org/fields/13",
"display_name": "Biochemistry, Genetics and Molecular Biology"
},
"domain": {
"id": "https://openalex.org/domains/1",
"display_name": "Life Sciences"
}
},
{
"id": "https://openalex.org/T10938",
"display_name": "Thermal Energy Storage with Phase Change Materials",
"value": 0.0002169,
"subfield": {
"id": "https://openalex.org/subfields/2210",
"display_name": "Mechanical Engineering"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T10049",
"display_name": "Magnetic Skyrmions and Spintronics",
"value": 0.0002164,
"subfield": {
"id": "https://openalex.org/subfields/3107",
"display_name": "Atomic and Molecular Physics, and Optics"
},
"field": {
"id": "https://openalex.org/fields/31",
"display_name": "Physics and Astronomy"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T11740",
"display_name": "Geochemistry of Manganese Oxides in Sedimentary Environments",
"value": 0.0001619,
"subfield": {
"id": "https://openalex.org/subfields/1906",
"display_name": "Geochemistry and Petrology"
},
"field": {
"id": "https://openalex.org/fields/19",
"display_name": "Earth and Planetary Sciences"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T11774",
"display_name": "Thermochemical Energy Storage and Sorption Technologies",
"value": 0.0001138,
"subfield": {
"id": "https://openalex.org/subfields/2210",
"display_name": "Mechanical Engineering"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T12039",
"display_name": "Surface Analysis and Electron Spectroscopy Techniques",
"value": 0.0001096,
"subfield": {
"id": "https://openalex.org/subfields/2508",
"display_name": "Surfaces, Coatings and Films"
},
"field": {
"id": "https://openalex.org/fields/25",
"display_name": "Materials Science"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T13644",
"display_name": "Vibration Suppression in Drive Systems",
"value": 9.7e-05,
"subfield": {
"id": "https://openalex.org/subfields/2210",
"display_name": "Mechanical Engineering"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T14128",
"display_name": "Materials Science and Engineering and Thermodynamics",
"value": 9.41e-05,
"subfield": {
"id": "https://openalex.org/subfields/2500",
"display_name": "General Materials Science"
},
"field": {
"id": "https://openalex.org/fields/25",
"display_name": "Materials Science"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T11222",
"display_name": "Magnetostriction in Magnetic Materials",
"value": 8.94e-05,
"subfield": {
"id": "https://openalex.org/subfields/2504",
"display_name": "Electronic, Optical and Magnetic Materials"
},
"field": {
"id": "https://openalex.org/fields/25",
"display_name": "Materials Science"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T11372",
"display_name": "Hydraulic Systems Control and Optimization",
"value": 7.92e-05,
"subfield": {
"id": "https://openalex.org/subfields/2210",
"display_name": "Mechanical Engineering"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T11799",
"display_name": "Mechanics of Gecko Foot Adhesion",
"value": 7.22e-05,
"subfield": {
"id": "https://openalex.org/subfields/2211",
"display_name": "Mechanics of Materials"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T11183",
"display_name": "X-ray Imaging Techniques and Applications",
"value": 7.08e-05,
"subfield": {
"id": "https://openalex.org/subfields/3108",
"display_name": "Radiation"
},
"field": {
"id": "https://openalex.org/fields/31",
"display_name": "Physics and Astronomy"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T12200",
"display_name": "Electronic and Magnetic Properties of Half-Metallic Alloys",
"value": 7.02e-05,
"subfield": {
"id": "https://openalex.org/subfields/2504",
"display_name": "Electronic, Optical and Magnetic Materials"
},
"field": {
"id": "https://openalex.org/fields/25",
"display_name": "Materials Science"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T11897",
"display_name": "Quantitative Imaging of Living Cells with Holography",
"value": "7e-05",
"subfield": {
"id": "https://openalex.org/subfields/3107",
"display_name": "Atomic and Molecular Physics, and Optics"
},
"field": {
"id": "https://openalex.org/fields/31",
"display_name": "Physics and Astronomy"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T12976",
"display_name": "Influence of Magnetic Fields on Biological Systems",
"value": 6.86e-05,
"subfield": {
"id": "https://openalex.org/subfields/1314",
"display_name": "Physiology"
},
"field": {
"id": "https://openalex.org/fields/13",
"display_name": "Biochemistry, Genetics and Molecular Biology"
},
"domain": {
"id": "https://openalex.org/domains/1",
"display_name": "Life Sciences"
}
},
{
"id": "https://openalex.org/T11782",
"display_name": "Magnetic Materials and Devices",
"value": 6.23e-05,
"subfield": {
"id": "https://openalex.org/subfields/2504",
"display_name": "Electronic, Optical and Magnetic Materials"
},
"field": {
"id": "https://openalex.org/fields/25",
"display_name": "Materials Science"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T11224",
"display_name": "Electromagnetic Interference Shielding and Materials",
"value": 6.23e-05,
"subfield": {
"id": "https://openalex.org/subfields/2504",
"display_name": "Electronic, Optical and Magnetic Materials"
},
"field": {
"id": "https://openalex.org/fields/25",
"display_name": "Materials Science"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T12809",
"display_name": "Computational Contact Mechanics and Variational Inequalities",
"value": 6.22e-05,
"subfield": {
"id": "https://openalex.org/subfields/1703",
"display_name": "Computational Theory and Mathematics"
},
"field": {
"id": "https://openalex.org/fields/17",
"display_name": "Computer Science"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T12358",
"display_name": "Kinetic Analysis of Thermal Processes in Materials",
"value": 6.16e-05,
"subfield": {
"id": "https://openalex.org/subfields/2505",
"display_name": "Materials Chemistry"
},
"field": {
"id": "https://openalex.org/fields/25",
"display_name": "Materials Science"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T13619",
"display_name": "Rock Mechanics and Wave Propagation in Geomedia",
"value": 6.08e-05,
"subfield": {
"id": "https://openalex.org/subfields/2211",
"display_name": "Mechanics of Materials"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T11089",
"display_name": "Environmental Impacts of Fukushima Nuclear Disaster",
"value": 6.03e-05,
"subfield": {
"id": "https://openalex.org/subfields/2306",
"display_name": "Global and Planetary Change"
},
"field": {
"id": "https://openalex.org/fields/23",
"display_name": "Environmental Science"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T12405",
"display_name": "Magnetic Particle Imaging and Ferrofluid Research",
"value": 5.83e-05,
"subfield": {
"id": "https://openalex.org/subfields/2204",
"display_name": "Biomedical Engineering"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T11565",
"display_name": "Thermoelastic Damping and Heat Conduction",
"value": 5.75e-05,
"subfield": {
"id": "https://openalex.org/subfields/2211",
"display_name": "Mechanics of Materials"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T10973",
"display_name": "Chemistry of Actinide and Lanthanide Elements",
"value": 5.72e-05,
"subfield": {
"id": "https://openalex.org/subfields/1604",
"display_name": "Inorganic Chemistry"
},
"field": {
"id": "https://openalex.org/fields/16",
"display_name": "Chemistry"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
},
{
"id": "https://openalex.org/T10633",
"display_name": "Mechanical Properties of Metallic Glasses",
"value": 5.5e-05,
"subfield": {
"id": "https://openalex.org/subfields/2210",
"display_name": "Mechanical Engineering"
},
"field": {
"id": "https://openalex.org/fields/22",
"display_name": "Engineering"
},
"domain": {
"id": "https://openalex.org/domains/3",
"display_name": "Physical Sciences"
}
}
],
"x_concepts": [
{
"id": "https://openalex.org/C121332964",
"wikidata": "https://www.wikidata.org/wiki/Q413",
"display_name": "Physics",
"level": 0,
"score": 91.7
},
{
"id": "https://openalex.org/C192562407",
"wikidata": "https://www.wikidata.org/wiki/Q228736",
"display_name": "Materials science",
"level": 0,
"score": 74.0
},
{
"id": "https://openalex.org/C62520636",
"wikidata": "https://www.wikidata.org/wiki/Q944",
"display_name": "Quantum mechanics",
"level": 1,
"score": 71.6
},
{
"id": "https://openalex.org/C127413603",
"wikidata": "https://www.wikidata.org/wiki/Q11023",
"display_name": "Engineering",
"level": 0,
"score": 68.4
},
{
"id": "https://openalex.org/C185592680",
"wikidata": "https://www.wikidata.org/wiki/Q2329",
"display_name": "Chemistry",
"level": 0,
"score": 54.2
},
{
"id": "https://openalex.org/C120665830",
"wikidata": "https://www.wikidata.org/wiki/Q14620",
"display_name": "Optics",
"level": 1,
"score": 46.4
},
{
"id": "https://openalex.org/C41008148",
"wikidata": "https://www.wikidata.org/wiki/Q21198",
"display_name": "Computer science",
"level": 0,
"score": 45.3
},
{
"id": "https://openalex.org/C178790620",
"wikidata": "https://www.wikidata.org/wiki/Q11351",
"display_name": "Organic chemistry",
"level": 1,
"score": 45.3
},
{
"id": "https://openalex.org/C159985019",
"wikidata": "https://www.wikidata.org/wiki/Q181790",
"display_name": "Composite material",
"level": 1,
"score": 41.3
},
{
"id": "https://openalex.org/C97355855",
"wikidata": "https://www.wikidata.org/wiki/Q11473",
"display_name": "Thermodynamics",
"level": 1,
"score": 37.8
},
{
"id": "https://openalex.org/C86803240",
"wikidata": "https://www.wikidata.org/wiki/Q420",
"display_name": "Biology",
"level": 0,
"score": 35.4
},
{
"id": "https://openalex.org/C127313418",
"wikidata": "https://www.wikidata.org/wiki/Q1069",
"display_name": "Geology",
"level": 0,
"score": 33.8
},
{
"id": "https://openalex.org/C33923547",
"wikidata": "https://www.wikidata.org/wiki/Q395",
"display_name": "Mathematics",
"level": 0,
"score": 32.7
},
{
"id": "https://openalex.org/C119599485",
"wikidata": "https://www.wikidata.org/wiki/Q43035",
"display_name": "Electrical engineering",
"level": 1,
"score": 28.2
},
{
"id": "https://openalex.org/C205649164",
"wikidata": "https://www.wikidata.org/wiki/Q1071",
"display_name": "Geography",
"level": 0,
"score": 28.2
},
{
"id": "https://openalex.org/C191897082",
"wikidata": "https://www.wikidata.org/wiki/Q11467",
"display_name": "Metallurgy",
"level": 1,
"score": 27.1
},
{
"id": "https://openalex.org/C171250308",
"wikidata": "https://www.wikidata.org/wiki/Q11468",
"display_name": "Nanotechnology",
"level": 1,
"score": 24.4
},
{
"id": "https://openalex.org/C26873012",
"wikidata": "https://www.wikidata.org/wiki/Q214781",
"display_name": "Condensed matter physics",
"level": 1,
"score": 23.3
},
{
"id": "https://openalex.org/C42360764",
"wikidata": "https://www.wikidata.org/wiki/Q83588",
"display_name": "Chemical engineering",
"level": 1,
"score": 22.8
},
{
"id": "https://openalex.org/C185544564",
"wikidata": "https://www.wikidata.org/wiki/Q81197",
"display_name": "Nuclear physics",
"level": 1,
"score": 22.8
},
{
"id": "https://openalex.org/C153294291",
"wikidata": "https://www.wikidata.org/wiki/Q25261",
"display_name": "Meteorology",
"level": 1,
"score": 20.4
}
],
"counts_by_year": [
{
"year": 2024,
"works_count": 6,
"cited_by_count": 92
},
{
"year": 2023,
"works_count": 11,
"cited_by_count": 106
},
{
"year": 2022,
"works_count": 9,
"cited_by_count": 127
},
{
"year": 2021,
"works_count": 10,
"cited_by_count": 103
},
{
"year": 2020,
"works_count": 10,
"cited_by_count": 117
},
{
"year": 2019,
"works_count": 9,
"cited_by_count": 106
},
{
"year": 2018,
"works_count": 5,
"cited_by_count": 109
},
{
"year": 2017,
"works_count": 4,
"cited_by_count": 84
},
{
"year": 2016,
"works_count": 6,
"cited_by_count": 135
},
{
"year": 2015,
"works_count": 9,
"cited_by_count": 84
},
{
"year": 2014,
"works_count": 5,
"cited_by_count": 47
},
{
"year": 2013,
"works_count": 5,
"cited_by_count": 55
},
{
"year": 2012,
"works_count": 4,
"cited_by_count": 44
}
],
"works_api_url": "https://api.openalex.org/works?filter=author.id:A5011153385",
"updated_date": "2024-08-21T06:40:43.808783",
"created_date": "2023-07-21",
"_id": "https://openalex.org/A5011153385"
},
"ORCID": {
"@context": "http://schema.org",
"@type": "Person",
"@id": "https://orcid.org/0000-0003-0707-8954",
"mainEntityOfPage": "https://orcid.org/0000-0003-0707-8954",
"givenName": "Yoshio",
"familyName": "Takahashi",
"@reverse": {
"creator": [
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1093/jmicro/dfad062",
"name": "Removal of phase residues in electron holography",
"identifier": {
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1093/jmicro/dfad062"
}
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1093/jmicro/dfae030",
"name": "Simultaneous observation of multiple interferograms with Mach-Zehnder type electron interferometer on a 1.2-MV field-emission transmission electron microscope",
"identifier": {
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1093/jmicro/dfae030"
}
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1002/adma.202311737",
"name": "Bloch Point Quadrupole Constituting Hybrid Topological Strings Revealed with Electron Holographic Vector Field Tomography",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1002/adma.202311737"
},
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-85182658261"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1002/adma.202306441",
"name": "Spontaneous Vortex-Antivortex Pairs and Their Topological Transitions in a Chiral-Lattice Magnet",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1002/adma.202306441"
},
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-85176576464"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.48550/arxiv.2308.14219",
"name": "Discovery of a Bloch point quadrupole constituting hybrid topological strings",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.48550/arxiv.2308.14219"
},
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-85171851970"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1093/micmic/ozad067.859",
"name": "Electron Holography Observation of Magnetic Bubbles and Stripe-shaped Domains under a Magnetic Field",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1093/micmic/ozad067.859"
},
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-85168600656"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1109/irmmw-thz57677.2023.10298919",
"name": "NanoMi: A modular platform for terahertz-integrated UTEM",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-85177634659"
},
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1109/irmmw-thz57677.2023.10298919"
},
{
"@type": "PropertyValue",
"propertyID": "isbn",
"value": "9798350336603"
}
],
"sameAs": "https://www.worldcat.org/isbn/9798350336603"
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1093/micmic/ozad067.232",
"name": "NanoMi: Progress on an Open-source Electron Microscope",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-85168614868"
},
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1093/micmic/ozad067.232"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1380/ejssnt.2023-039",
"name": "Sophisticated Double-Slit Interference Experiments Using Electron Waves",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-85160830013"
},
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1380/ejssnt.2023-039"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1126/science.abq5868",
"name": "Direct identification of the charge state in a single platinum nanoparticle on titanium oxide",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-85140139225"
},
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1126/science.abq5868"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1017/s1431927622003531",
"name": "Development of Observation Method for Spatial Electromagnetic Fields by Using Conventional Scanning Electron/Ion Microscope",
"identifier": {
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1017/s1431927622003531"
}
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1017/s1431927622011254",
"name": "Phase-residue Removal Based on Sparse Modeling in Electron Holography",
"identifier": {
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1017/s1431927622011254"
}
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1093/jmicro/dfac006",
"name": "Analysis of spatial point patterns in electron-counting images",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-85131701005"
},
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1093/jmicro/dfac006"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1093/jmicro/dfab054",
"name": "Lorentz scanning electron/ion microscopy",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1093/jmicro/dfab054"
},
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-85128160934"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1063/5.0074231",
"name": "Automatic electron hologram acquisition of catalyst nanoparticles using particle detection with image processing and machine learning",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-85124471015"
},
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1063/5.0074231"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1016/j.micron.2022.103306",
"name": "Electron holography for observing magnetic bubbles and stripe-shaped domains in magnetic fields",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-85132237056"
},
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1016/j.micron.2022.103306"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1016/j.jmmm.2021.168593",
"name": "Magnetic imaging using ultra-high-voltage cold-field-emission microscopes",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1016/j.jmmm.2021.168593"
},
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-85116038800"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1093/jmicro/dfab021",
"name": "Improved efficiency in automated acquisition of ultra-high-resolution electron holograms using automated target detection",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1093/jmicro/dfab021"
},
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-85121151841"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1093/jmicro/dfab012",
"name": "Deep convolutional neural network image processing method providing improved signal-to-noise ratios in electron holography",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1093/jmicro/dfab012"
},
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-85116977341"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1017/s1431927621008308",
"name": "Mapping electrostatic potential around a Pt nanoparticle supported on TiO2 (110)",
"identifier": {
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1017/s1431927621008308"
}
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1017/s1431927621008333",
"name": "Schlieren imaging of spatial magnetic fields by hollow-cone illumination",
"identifier": {
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1017/s1431927621008333"
}
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1093/jmicro/dfaa050",
"name": "Holography: application to high-resolution imaging",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1093/jmicro/dfaa050"
},
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-85102212019"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.35848/1882-0786/abd91e",
"name": "Electron interference experiment with optically zero propagation distance for V-shaped double slit",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-85100432327"
},
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.35848/1882-0786/abd91e"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1093/jmicro/dfaa040",
"name": "Development of a Mach-Zehnder type electron interferometer on a 1.2-MV field-emission transmission electron microscope",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1093/jmicro/dfaa040"
},
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-85099477607"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1017/s1431927620020589",
"name": "Automated Acquisition and High-precision Phase Analysis of Vast Numbers of Electron Holograms of Nanoparticles",
"identifier": {
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1017/s1431927620020589"
}
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1017/s1431927620020620",
"name": "Double-Slit Electron Interference Experiment with Phase Modulation",
"identifier": {
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1017/s1431927620020620"
}
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1093/jmicro/dfaa008",
"name": "Lensless Fourier transform electron holography applied to vortex beam analysis",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-85085265556"
},
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1093/jmicro/dfaa008"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1093/jmicro/dfaa004",
"name": "Automated acquisition of vast numbers of electron holograms with atomic-scale phase information",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1093/jmicro/dfaa004"
},
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-85083077610"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1017/s1431927620021741",
"name": "Lens-less Fourier Transform Holography for Electron Vortex Beams",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1017/s1431927620021741"
},
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-85092248364"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1016/j.ultramic.2018.11.012",
"name": "A 0.5-T pure-in-plane-field magnetizing holder for in-situ Lorentz microscopy.",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1016/j.ultramic.2018.11.012"
},
{
"@type": "PropertyValue",
"propertyID": "pmid",
"value": "30572301"
},
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-85058554511"
}
],
"sameAs": "https://pubmed.ncbi.nlm.nih.gov/30572301"
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1093/jmicro/dfy031",
"name": "Illumination semiangle of 10-9 rad achieved in a 1.2-MV atomic resolution holography transmission electron microscope",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-85054448349"
},
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1093/jmicro/dfy031"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1063/1.4991859",
"name": "Imaging of potential gradient on platinum induced by hydrogen adsorption",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1063/1.4991859"
},
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-85022206716"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1093/jmicro/dfw009",
"name": "Information transfer of 25.5 nm-1 in a 1-MV field-emission transmission electron microscope.",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-84988354681"
},
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1093/jmicro/dfw009"
},
{
"@type": "PropertyValue",
"propertyID": "pmid",
"value": "27013274"
}
],
"sameAs": "https://pubmed.ncbi.nlm.nih.gov/27013274"
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1088/0022-3727/49/24/244001",
"name": "New trend in electron holography",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1088/0022-3727/49/24/244001"
},
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-84971643784"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1016/bs.aiep.2016.08.004",
"name": "Quest for Ultimate Resolution Using Coherent Electron Waves: An Aberration-Corrected High-Voltage Electron Microscope",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1016/bs.aiep.2016.08.004"
},
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-84992107907"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1063/1.4908175",
"name": "Aberration corrected 1.2-MV cold field-emission transmission electron microscope with a sub-50-pm resolution",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-84923350656"
},
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1063/1.4908175"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1021/nl504473a",
"name": "Three-dimensional observation of magnetic vortex cores in stacked ferromagnetic discs.",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-84922811437"
},
{
"@type": "PropertyValue",
"propertyID": "pmid",
"value": "25594686"
},
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1021/nl504473a"
}
],
"sameAs": "https://pubmed.ncbi.nlm.nih.gov/25594686"
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1038/nnano.2014.52",
"name": "Observation of the magnetic flux and three-dimensional structure of skyrmion lattices by electron holography.",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-84901277045"
},
{
"@type": "PropertyValue",
"propertyID": "pmid",
"value": "24727689"
},
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1038/nnano.2014.52"
}
],
"sameAs": "https://pubmed.ncbi.nlm.nih.gov/24727689"
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1017/s1431927613007733",
"name": "Development of a Contact-Potential-Type Phase Plate",
"identifier": {
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1017/s1431927613007733"
}
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1016/j.ijleo.2010.07.015",
"name": "Transition from statistical Coulomb interactions to averaged space-charge effect",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-79956098396"
},
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1016/j.ijleo.2010.07.015"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1088/1742-6596/200/10/102001",
"name": "Local compositional analysis of magnetic crystal grain and boundary in CoCrPt-SiO<inf>2</inf> granular perpendicular recording media",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-77957064432"
},
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1088/1742-6596/200/10/102001"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1109/tmag.2008.2002509",
"name": "Compositional structure and magnetic properties of CoCrPt-SiO<inf>x</inf> perpendicular recording medium",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1109/tmag.2008.2002509"
},
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-77952797091"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1143/apex.1.037001",
"name": "Correlation imaging of magnetic recorded patterns and grain structures of perpendicular magnetic-recording media",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1143/apex.1.037001"
},
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-57049109354"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1109/tmag.2008.2002415",
"name": "High-resolution TEM analysis of perpendicular CoCrPt-SiO<inf>2</inf> media",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1109/tmag.2008.2002415"
},
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-70249138831"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1016/j.mee.2008.05.018",
"name": "Mirror electron microscope for inspecting nanometer-sized defects in magnetic media",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-48949115553"
},
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1016/j.mee.2008.05.018"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1016/j.jmmm.2008.08.053",
"name": "Ordering and grain growth of FePt thin films by annealing",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-53749102827"
},
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1016/j.jmmm.2008.08.053"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1063/1.1874310",
"name": "Distribution of blocking temperature in exchange-coupled Fe3 O4 -CrMnPt system",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1063/1.1874310"
},
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-17044376749"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1063/1.1630356",
"name": "Observation of magnetic structures in Fe granular films by differential phase contrast scanning transmission electron microscopy",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-0942290066"
},
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1063/1.1630356"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1109/tmag.2003.816281",
"name": "CoB/Pd Multilayers with PtB/Pd/MgO Intermediate Layers for Perpendicular Magnetic Recording",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1109/tmag.2003.816281"
},
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-0141988611"
}
]
},
{
"@type": "CreativeWork",
"name": "CoB/Pd multilayer with PtB/Pd/MgO intermediate layer for perpendicular magnetic recording",
"identifier": {
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-0141456449"
}
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1109/intmag.2003.1230450",
"name": "CoB/Pd multilayer with PtB/Pd/MgO intermediate layer for perpendicular magnetic recording",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1109/intmag.2003.1230450"
},
{
"@type": "PropertyValue",
"propertyID": "isbn",
"value": "0780376471"
},
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-84949516549"
}
],
"sameAs": "https://www.worldcat.org/isbn/0780376471"
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1063/1.1557720",
"name": "Laminated nanocrystalline soft underlayers for perpendicular recording",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1063/1.1557720"
},
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-0038386072"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1063/1.1515102",
"name": "Effect of crystallographic orientation on grain size distribution",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1063/1.1515102"
},
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-18744392515"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1063/1.1456049",
"name": "Low noise antiferromagnetically coupled media with CrTiB underlayer",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1063/1.1456049"
},
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-0037094882"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1016/s0304-8853(01)01222-7",
"name": "Low-noise FeTaC underlayer for double-layered perpendicular recording media",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1016/s0304-8853(01)01222-7"
},
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-0036530454"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1063/1.1458012",
"name": "Stacking faults in Co-Cr-Pt perpendicular magnetic recording media",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1063/1.1458012"
},
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-0037094596"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.2320/materia.40.774",
"name": "Current Status and Future Trend for CoCr Based Alloy Recording Media",
"identifier": {
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.2320/materia.40.774"
}
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1109/20.947061",
"name": "Effects of surface oxidization of amorphous Ni-based alloy seed layers on noise in CoCrPt/CrTi media",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-0035386078"
},
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1109/20.947061"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1016/s0304-8853(01)00299-2",
"name": "Low-noise CoCrPt/FeTaC double-layered perpendicular media with NiTaZr intermediate layer",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-0035476771"
},
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1016/s0304-8853(01)00299-2"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.2320/materia.40.1019",
"name": "Magnetic Clusters in Fe Granular Thin Films",
"identifier": {
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.2320/materia.40.1019"
}
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.2320/materia.40.1018",
"name": "Quantitative Analyses of Local Magnetization Distribution by Scanning Interference Electron Microscopy",
"identifier": {
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.2320/materia.40.1018"
}
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1109/20.908433",
"name": "Effects of surface oxidization of amorphous Ni-based alloy seed layers on noise in CoCrPt/CrTi media",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-0034260581"
},
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1109/20.908433"
}
]
},
{
"@type": "CreativeWork",
"name": "Effects of surface oxidization of amorphous Ni-based alloy seed layers on noise of CoCrPt/CrTi media",
"identifier": {
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-0033696486"
}
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1063/1.372494",
"name": "Structural properties of polycrystalline Co\u2013Cr\u2013X (X=Pt and/or Ta)/Cr-alloy magnetic recording media",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-0001080131"
},
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1063/1.372494"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1017/s1431927600013519",
"name": "Lorentz And Interference Electron Microscopy On A Scanning Tem",
"identifier": {
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1017/s1431927600013519"
}
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1063/1.370458",
"name": "Effects of CoCrZr seed layer on noise properties and microstructure of CoCrPt media",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1063/1.370458"
},
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-0001676313"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1016/s0304-8853(98)00403-x",
"name": "Effects of Cr-N-ZrO<inf>2</inf> seed layer formed on glass substrates for longitudinal recording media",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1016/s0304-8853(98)00403-x"
},
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-0033100069"
}
]
},
{
"@type": "CreativeWork",
"name": "Effects of underlayer grain size on the microstructure of the magnetic layer in CoCrPt media",
"identifier": {
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-0033298324"
}
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1109/20.800941",
"name": "Effects of underlayer grain size on the microstructure of the magnetic layer in CoCrPt media",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-0033184295"
},
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1109/20.800941"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1109/20.800925",
"name": "Noise reduction by surface oxidization of a CoCrZr seed layer on glass substrates for CoCrPt/CrTi thin film media",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-0033184125"
},
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1109/20.800925"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1016/s0304-8853(98)00433-8",
"name": "Reduction of thermal decay in longitudinal recording media with a CoCr intermediate layer",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1016/s0304-8853(98)00433-8"
},
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-0033099342"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1063/1.368213",
"name": "Quantification of local remanence magnetization in perpendicular magnetic recording film by scanning interference electron microscopy",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-0032132431"
},
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1063/1.368213"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1109/20.706605",
"name": "Thermal aftereffects in thin film magnetic recording media",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-0032114574"
},
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1109/20.706605"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1109/20.617817",
"name": "Effects of boron addition to underlayer for cocrpt media on magnetic characteristics and microstructure",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-0031220980"
},
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1109/20.617817"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1016/s0304-8853(97)00202-3",
"name": "Monte Carlo simulation of thermal fluctuation in magnetization of longitudinal and perpendicular magnetic recording media",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-0031250197"
},
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1016/s0304-8853(97)00202-3"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1143/jjap.35.2851",
"name": "Electron phase counting micromagnetometry using a differential phase contrast/interference scanning transmission electron microscope",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-0030142314"
},
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1143/jjap.35.2851"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1109/20.490384",
"name": "Analysis of Magnetic Induction Distribution by Scanning Lorentz/Interference Electron Microscopy",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1109/20.490384"
},
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-0029409739"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1063/1.358466",
"name": "Nonmagnetic contrast in scanning Lorentz electron microscopy of polycrystalline magnetic films",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-0942270326"
},
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1063/1.358466"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1143/jjap.33.l1352",
"name": "Observation of magnetic induction distribution by scanning interference electron microscopy",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1143/jjap.33.l1352"
},
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-0028506941"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1143/jjap.32.3308",
"name": "Magnetization Contrast Enhancement of Recorded Magnetic Storage Media in Scanning Lorentz Electron Microscopy",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-0027628384"
},
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1143/jjap.32.3308"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1063/1.353534",
"name": "Scanning Lorentz electron microscope with high resolution and observation of bit profiles recorded on sputtered longitudinal media (invited)",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1063/1.353534"
},
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-0942292062"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1143/jjap.30.3233",
"name": "Focused ion beam induced deposition in the high current density region",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1143/jjap.30.3233"
},
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-0026259339"
}
]
},
{
"@type": "CreativeWork",
"@id": "https://doi.org/10.1143/jjap.30.l518",
"name": "Growth of tungsten film by focused ion beam induced deposition",
"identifier": [
{
"@type": "PropertyValue",
"propertyID": "eid",
"value": "2-s2.0-0026123127"
},
{
"@type": "PropertyValue",
"propertyID": "doi",
"value": "10.1143/jjap.30.l518"
}
]
}
]
},
"identifier": {
"@type": "PropertyValue",
"propertyID": "Scopus Author ID",
"value": "55705424500"
}
}
}
