Universal Instruments (United States) (Q333046)

From geokb

company organization in New York, United States

Language	Label	Description	Also known as
English	Universal Instruments (United States)	company organization in New York, United States

Statements

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addresses subject

Advances in Lead-free Soldering for Microelectronics

116

1 reference

https://openalex.org/I4210147517

Three-Dimensional Integrated Circuits

64

1 reference

https://openalex.org/I4210147517

Aluminium Alloys for Aerospace and Automotive Applications

17

1 reference

https://openalex.org/I4210147517

Design and Applications of Intermetallic Alloys

13

1 reference

https://openalex.org/I4210147517

Design for Manufacture and Assembly in Manufacturing

13

1 reference

https://openalex.org/I4210147517

Failure Analysis of Integrated Circuits

11

1 reference

https://openalex.org/I4210147517

Dynamic Recrystallization in Metal Deformation Processes

10

1 reference

https://openalex.org/I4210147517

Mechanics and Properties of Paper Materials

9

1 reference

https://openalex.org/I4210147517

Additive Manufacturing and 3D Printing Technologies

9

1 reference

https://openalex.org/I4210147517

Low Dielectric Constant Materials for Microelectronics

8

1 reference

https://openalex.org/I4210147517

Physics and Chemistry of Schottky Barrier Height

8

1 reference

https://openalex.org/I4210147517

Metal Matrix Composites: Science and Applications

8

1 reference

https://openalex.org/I4210147517

Optical Interconnect Technologies

8

1 reference

https://openalex.org/I4210147517

Fundamental Issues in Flow Boiling Heat Transfer

7

1 reference

https://openalex.org/I4210147517

Microchannel Heat Transfer and Cooling Technology

7

1 reference

https://openalex.org/I4210147517

Ductile Fracture in Sheet Metal Forming

7

1 reference

https://openalex.org/I4210147517

Nanoscale Thermal Transport in Carbon Materials

6

1 reference

https://openalex.org/I4210147517

Electrostatic Discharge Protection in Integrated Circuits

6

1 reference

https://openalex.org/I4210147517

Electromagnetic Compatibility in Electronics

6

1 reference

https://openalex.org/I4210147517

Fabric Defect Detection in Industrial Applications

6

1 reference

https://openalex.org/I4210147517

Atomic Layer Deposition Technology

6

1 reference

https://openalex.org/I4210147517

Dynamics and Stability of Thin Liquid Films

5

1 reference

https://openalex.org/I4210147517

Mechanics of Gecko Foot Adhesion

5

1 reference

https://openalex.org/I4210147517

Composite Materials and Structures

5

1 reference

https://openalex.org/I4210147517

coordinate location

42°2'13"N, 75°48'46"W

1 reference

https://openalex.org/I4210147517

United States of America

1 reference

https://openalex.org/I4210147517

official website

http://www.uic.com/

1 reference

https://openalex.org/I4210147517

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Research Organization Registry ID

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