Spire Corporation (United States) (Q332717)

From geokb

company organization in Bedford, United States

Language	Label	Description	Also known as
English	Spire Corporation (United States)	company organization in Bedford, United States

Statements

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addresses subject

Silicon Solar Cell Technology

139

1 reference

https://openalex.org/I4210163472

Atomic Layer Deposition Technology

124

1 reference

https://openalex.org/I4210163472

Quantum Dot Devices and Semiconductors

109

1 reference

https://openalex.org/I4210163472

Multijunction Solar Cell Technology

107

1 reference

https://openalex.org/I4210163472

Physics and Chemistry of Schottky Barrier Height

107

1 reference

https://openalex.org/I4210163472

Porous Silicon Nanoparticles and Nanostructures

86

1 reference

https://openalex.org/I4210163472

Thin-Film Solar Cell Technology

48

1 reference

https://openalex.org/I4210163472

Mechanical Properties of Thin Film Coatings

47

1 reference

https://openalex.org/I4210163472

Failure Analysis of Integrated Circuits

46

1 reference

https://openalex.org/I4210163472

Nanowire Nanosensors for Biomedical and Energy Applications

44

1 reference

https://openalex.org/I4210163472

Plasmonics for Photovoltaic Devices

44

1 reference

https://openalex.org/I4210163472

Ion Beam Surface Analysis and Nanoscale Patterning

43

1 reference

https://openalex.org/I4210163472

Infrared Detector Technologies

37

1 reference

https://openalex.org/I4210163472

First-Principles Calculations for III-Nitride Semiconductors

33

1 reference

https://openalex.org/I4210163472

Silicon Photonics Technology

33

1 reference

https://openalex.org/I4210163472

Diamond Nanotechnology and Applications

30

1 reference

https://openalex.org/I4210163472

Nanoelectronics and Transistors

27

1 reference

https://openalex.org/I4210163472

Optical Interconnect Technologies

24

1 reference

https://openalex.org/I4210163472

Photovoltaic Maximum Power Point Tracking Techniques

17

1 reference

https://openalex.org/I4210163472

Scintillation Detector Technology

17

1 reference

https://openalex.org/I4210163472

Environmental Impacts of Solar Energy Technologies

14

1 reference

https://openalex.org/I4210163472

Fault Tolerance in Electronic Systems

14

1 reference

https://openalex.org/I4210163472

Chemical Mechanical Polishing in Microelectronics Manufacturing

14

1 reference

https://openalex.org/I4210163472

Gallium Oxide (Ga2O3) Semiconductor Materials and Devices

13

1 reference

https://openalex.org/I4210163472

Rheumatoid Arthritis Topics

13

1 reference

https://openalex.org/I4210163472

coordinate location

42°28'54"N, 71°15'58"W

1 reference

https://openalex.org/I4210163472

United States of America

1 reference

https://openalex.org/I4210163472

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Research Organization Registry ID

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