Scanning electron microscopic evaluation of broad ion beam milling effects to sedimentary organic matter: Sputter-induced artifacts or naturally occurring porosity? (Q269435)
From geokb
Journal Article published in 2023
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Scanning electron microscopic evaluation of broad ion beam milling effects to sedimentary organic matter: Sputter-induced artifacts or naturally occurring porosity? |
Journal Article published in 2023 |
