scanning electron microscopy (Q158880)
From geokb
Microscope in which a finely focused beam of electrons is scanned across a specimen. The electronic intensity variations observed are used to construct an image of the specimen.
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | scanning electron microscopy |
Microscope in which a finely focused beam of electrons is scanned across a specimen. The electronic intensity variations observed are used to construct an image of the specimen. |
