Scanning electron microscopic evaluation of broad ion beam milling effects to sedimentary organic matter: Sputter-induced artifacts or naturally occurring porosity? (Q269435)
From geokb
Journal Article published in 2023
Language | Label | Description | Also known as |
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English | Scanning electron microscopic evaluation of broad ion beam milling effects to sedimentary organic matter: Sputter-induced artifacts or naturally occurring porosity? |
Journal Article published in 2023 |