Scanning electron microscopic evaluation of broad ion beam milling effects to sedimentary organic matter: Sputter-induced artifacts or naturally occurring porosity? (Q269435)

From geokb
Revision as of 00:07, 22 August 2024 by Sky (talk | contribs) (‎Created a new Item: wrote item from USGS Publications Warehouse with subjects from OpenAlex)
(diff) ← Older revision | Latest revision (diff) | Newer revision → (diff)