Characterization of Surface Roughness in Optical Components (Q168640)

From geokb
Revision as of 14:29, 24 May 2024 by Sky (talk | contribs) (‎Created a new Item: Added new OpenAlex topic claimed by USGS staff from API)
(diff) ← Older revision | Latest revision (diff) | Newer revision → (diff)
This cluster of papers focuses on the characterization and measurement of surface roughness in optical components, utilizing techniques such as fractal analysis, machine vision, scattering theory, and thin film analysis
  • Surface Characterization
  • Roughness Measurement
  • Optical Components
  • Fractal Analysis
  • Machine Vision
  • Scattering Theory
  • Thin Film Analysis
  • Micromorphology
  • Power Spectral Density
  • Image Processing
Language Label Description Also known as
English
Characterization of Surface Roughness in Optical Components
This cluster of papers focuses on the characterization and measurement of surface roughness in optical components, utilizing techniques such as fractal analysis, machine vision, scattering theory, and thin film analysis
  • Surface Characterization
  • Roughness Measurement
  • Optical Components
  • Fractal Analysis
  • Machine Vision
  • Scattering Theory
  • Thin Film Analysis
  • Micromorphology
  • Power Spectral Density
  • Image Processing

Statements