Quantitative characterization of micro-topography a bibliography of industrial surface metrology (Q77084): Difference between revisions
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Property / addresses subject: Characterization of Surface Roughness in Optical Components / rank | |||
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Revision as of 01:25, 17 August 2024
Quantitative characterization of micro-topography a bibliography of industrial surface metrology; 1998; OFR; 98-768; Pike, R. J.; Thomas, T. R.
Language | Label | Description | Also known as |
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English | Quantitative characterization of micro-topography a bibliography of industrial surface metrology |
Quantitative characterization of micro-topography a bibliography of industrial surface metrology; 1998; OFR; 98-768; Pike, R. J.; Thomas, T. R. |
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