Characterization of Surface Roughness in Optical Components (Q168640): Difference between revisions

From geokb
(‎Changed label, description and/or aliases in en, and other parts: modified description with assistance from Llama 3.1)
(‎Changed label, description and/or aliases in en, and other parts: removed aliases from OpenAlex keywords)
 
(One intermediate revision by the same user not shown)
aliases / en / 0aliases / en / 0
Surface Characterization
aliases / en / 1aliases / en / 1
Roughness Measurement
aliases / en / 2aliases / en / 2
Optical Components
aliases / en / 3aliases / en / 3
Fractal Analysis
aliases / en / 4aliases / en / 4
Machine Vision
aliases / en / 5aliases / en / 5
Scattering Theory
aliases / en / 6aliases / en / 6
Thin Film Analysis
aliases / en / 7aliases / en / 7
Micromorphology
aliases / en / 8aliases / en / 8
Power Spectral Density
aliases / en / 9aliases / en / 9
Image Processing
Property / same as
 
Property / same as: https://openalex.org/T13049 / rank
Normal rank
 
Property / OpenAlex ID
 
Property / OpenAlex ID: T13049 / rank
 
Normal rank

Latest revision as of 20:39, 12 September 2024

Measuring surface roughness in optical components using techniques like fractal analysis and machine vision.
Language Label Description Also known as
English
Characterization of Surface Roughness in Optical Components
Measuring surface roughness in optical components using techniques like fractal analysis and machine vision.

    Statements