Quantitative characterization of micro-topography a bibliography of industrial surface metrology (Q77084): Difference between revisions
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| Property / addresses subject: Dimensional Metrology and Error Compensation / rank | |||
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| Property / addresses subject: Characterization of Surface Roughness in Optical Components / rank | |||
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| Property / addresses subject: Characterization of Surface Roughness in Optical Components / reference | |||
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Latest revision as of 02:51, 12 September 2024
Quantitative characterization of micro-topography a bibliography of industrial surface metrology; 1998; OFR; 98-768; Pike, R. J.; Thomas, T. R.
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Quantitative characterization of micro-topography a bibliography of industrial surface metrology |
Quantitative characterization of micro-topography a bibliography of industrial surface metrology; 1998; OFR; 98-768; Pike, R. J.; Thomas, T. R. |
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