Item talk:Q226490

{

 "OpenAlex": {
   "display_name": "Very Large Scale Integration Testing",
   "description": "This cluster of papers focuses on various aspects of testing Very Large Scale Integration (VLSI) circuits, including techniques such as test data compression, embedded cores testing, scan testing, analog circuit fault diagnosis, BIST schemes, test access architectures, low-power testing, and delay fault testing.",
   "keywords": [
     "Test Data Compression",
     "Embedded Cores",
     "Scan Testing",
     "Analog Circuit Fault Diagnosis",
     "BIST Scheme",
     "Test Access Architecture",
     "Low-Power Testing",
     "Test Vector Compression",
     "System-on-a-Chip Test",
     "Delay Fault Testing"
   ],
   "ids": {
     "openalex": "https://openalex.org/T11032",
     "wikipedia": "https://en.wikipedia.org/wiki/Very_Large_Scale_Integration#Testing"
   },
   "subfield": {
     "id": "https://openalex.org/subfields/1708",
     "display_name": "Hardware and Architecture"
   },
   "field": {
     "id": "https://openalex.org/fields/17",
     "display_name": "Computer Science"
   },
   "domain": {
     "id": "https://openalex.org/domains/3",
     "display_name": "Physical Sciences"
   },
   "updated_date": "2024-08-12T06:00:08.255261",
   "created_date": "2024-01-23",
   "type": "topic",
   "oa_id": "T11032",
   "id": "https://openalex.org/T11032"
 }

}