Item talk:Q168346

{

 "OpenAlex": {
   "display_name": "Electrostatic Discharge Protection in Integrated Circuits",
   "description": "This cluster of papers focuses on the design, analysis, and modeling of electrostatic discharge (ESD) protection in integrated circuits, particularly in CMOS technology. It covers topics such as SCR devices, LDMOS design, RF ESD protection, TLP calibration, high-voltage ESD solutions, and latchup immunity. The papers also discuss on-chip protection strategies and system-level ESD testing.",
   "keywords": [
     "ESD Protection",
     "CMOS Technology",
     "SCR Devices",
     "LDMOS Design",
     "RF ESD",
     "TLP Calibration",
     "High-Voltage ESD",
     "Latchup Immunity",
     "On-Chip Protection",
     "System-Level ESD Test"
   ],
   "ids": {
     "openalex": "https://openalex.org/T12495",
     "wikipedia": "https://en.wikipedia.org/wiki/Electrostatic_discharge"
   },
   "subfield": {
     "id": "https://openalex.org/subfields/2208",
     "display_name": "Electrical and Electronic Engineering"
   },
   "field": {
     "id": "https://openalex.org/fields/22",
     "display_name": "Engineering"
   },
   "domain": {
     "id": "https://openalex.org/domains/3",
     "display_name": "Physical Sciences"
   },
   "updated_date": "2024-08-12T05:54:30.665940",
   "created_date": "2024-01-23",
   "type": "topic",
   "oa_id": "T12495",
   "id": "https://openalex.org/T12495"
 }

}