Analysis of background residential dust for World Trade Center signature components using scanning electron microscopy and x-ray microanalysis (Q69571)
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Analysis of background residential dust for World Trade Center signature components using scanning electron microscopy and x-ray microanalysis; 2005; OFR; 2005-1073; Lowers, Heather A.; Meeker, Gregory P.; Brownfield, Isabelle K.
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Analysis of background residential dust for World Trade Center signature components using scanning electron microscopy and x-ray microanalysis |
Analysis of background residential dust for World Trade Center signature components using scanning electron microscopy and x-ray microanalysis; 2005; OFR; 2005-1073; Lowers, Heather A.; Meeker, Gregory P.; Brownfield, Isabelle K. |
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