IBM Research - Thomas J. Watson Research Center (Q332420)

facility organization in Yorktown Heights, United States

Thomas J. Watson Research Center

Language	Label	Description	Also known as
English	IBM Research - Thomas J. Watson Research Center	facility organization in Yorktown Heights, United States	Thomas J. Watson Research Center

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research facility

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addresses subject

Atomic Layer Deposition Technology

prevalence

3,949

1 reference

reference URL

https://openalex.org/I4210114115

Nanoelectronics and Transistors

prevalence

2,176

1 reference

reference URL

https://openalex.org/I4210114115

Parallel Computing and Performance Optimization

prevalence

1,692

1 reference

reference URL

https://openalex.org/I4210114115

Physics and Chemistry of Schottky Barrier Height

prevalence

1,420

1 reference

reference URL

https://openalex.org/I4210114115

Quantum Dot Devices and Semiconductors

prevalence

1,352

1 reference

reference URL

https://openalex.org/I4210114115

Failure Analysis of Integrated Circuits

prevalence

1,294

1 reference

reference URL

https://openalex.org/I4210114115

High-Temperature Superconductivity

prevalence

1,201

1 reference

reference URL

https://openalex.org/I4210114115

Semiconductor Spintronics and Quantum Computing

prevalence

1,200

1 reference

reference URL

https://openalex.org/I4210114115

Quantum Size Effects in Metallic Nanostructures

prevalence

1,045

1 reference

reference URL

https://openalex.org/I4210114115

Low-Power VLSI Circuit Design and Optimization

prevalence

959

1 reference

reference URL

https://openalex.org/I4210114115

Distributed Storage Systems and Network Coding

prevalence

938

1 reference

reference URL

https://openalex.org/I4210114115

Distributed Fault Tolerance and Consistency in Systems

prevalence

936

1 reference

reference URL

https://openalex.org/I4210114115

Surface Analysis and Electron Spectroscopy Techniques

prevalence

925

1 reference

reference URL

https://openalex.org/I4210114115

Magnetic Skyrmions and Spintronics

prevalence

860

1 reference

reference URL

https://openalex.org/I4210114115

Distributed Grid Computing Systems

prevalence

842

1 reference

reference URL

https://openalex.org/I4210114115

Low Dielectric Constant Materials for Microelectronics

prevalence

832

1 reference

reference URL

https://openalex.org/I4210114115

Networks on Chip in System-on-Chip Design

prevalence

824

1 reference

reference URL

https://openalex.org/I4210114115

Silicon Solar Cell Technology

prevalence

823

1 reference

reference URL

https://openalex.org/I4210114115

Silicon Photonics Technology

prevalence

795

1 reference

reference URL

https://openalex.org/I4210114115

Cloud Computing and Big Data Technologies

prevalence

777

1 reference

reference URL

https://openalex.org/I4210114115

Plasmonics for Photovoltaic Devices

prevalence

679

1 reference

reference URL

https://openalex.org/I4210114115

Advancements in Density Functional Theory

prevalence

660

1 reference

reference URL

https://openalex.org/I4210114115

Electron Beam Lithography: Resolution and Applications

prevalence

629

1 reference

reference URL

https://openalex.org/I4210114115

Very Large Scale Integration Testing

prevalence

629

1 reference

reference URL

https://openalex.org/I4210114115

Optical Interconnect Technologies

prevalence

627

1 reference

reference URL

https://openalex.org/I4210114115

coordinate location

41°12'37"N, 73°48'11"W

1 reference

reference URL

https://openalex.org/I4210114115

country

United States of America

1 reference

reference URL

https://openalex.org/I4210114115

OpenAlex ID

I4210114115

0 references

Research Organization Registry ID

0265w5591

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