(Q335198)

Statements

0 references

addresses subject

Ion Beam Surface Analysis and Nanoscale Patterning

163

1 reference

https://openalex.org/I4210129820

Atomic Layer Deposition Technology

132

1 reference

https://openalex.org/I4210129820

Failure Analysis of Integrated Circuits

128

1 reference

https://openalex.org/I4210129820

Silicon Solar Cell Technology

121

1 reference

https://openalex.org/I4210129820

Physics and Chemistry of Schottky Barrier Height

86

1 reference

https://openalex.org/I4210129820

Surface Analysis and Electron Spectroscopy Techniques

72

1 reference

https://openalex.org/I4210129820

Plasmonics for Photovoltaic Devices

33

1 reference

https://openalex.org/I4210129820

Three-Dimensional Integrated Circuits

30

1 reference

https://openalex.org/I4210129820

Quantum Dot Devices and Semiconductors

30

1 reference

https://openalex.org/I4210129820

Infrared Detector Technologies

28

1 reference

https://openalex.org/I4210129820

Advances in Lead-free Soldering for Microelectronics

28

1 reference

https://openalex.org/I4210129820

Porous Silicon Nanoparticles and Nanostructures

27

1 reference

https://openalex.org/I4210129820

First-Principles Calculations for III-Nitride Semiconductors

20

1 reference

https://openalex.org/I4210129820

Analytical Chemistry Techniques

20

1 reference

https://openalex.org/I4210129820

Public-Private Partnerships in Infrastructure Development

19

1 reference

https://openalex.org/I4210129820

Mass Spectrometry Techniques

19

1 reference

https://openalex.org/I4210129820

Mechanical Properties of Thin Film Coatings

19

1 reference

https://openalex.org/I4210129820

Thin-Film Solar Cell Technology

17

1 reference

https://openalex.org/I4210129820

Atom Probe Tomography Research

16

1 reference

https://openalex.org/I4210129820

X-ray Absorption Spectroscopy

16

1 reference

https://openalex.org/I4210129820

Diamond Nanotechnology and Applications

16

1 reference

https://openalex.org/I4210129820

Neutron Imaging and Analysis Techniques

15

1 reference

https://openalex.org/I4210129820

Gallium Oxide (Ga2O3) Semiconductor Materials and Devices

14

1 reference

https://openalex.org/I4210129820

Low Dielectric Constant Materials for Microelectronics

14

1 reference

https://openalex.org/I4210129820

Success Factors in Project Management

14

1 reference

https://openalex.org/I4210129820

coordinate location

37°22'24"N, 121°58'31"W

1 reference

https://openalex.org/I4210129820

United States of America

1 reference

https://openalex.org/I4210129820

official website

http://www.eag.com/

1 reference

https://openalex.org/I4210129820

0 references

Research Organization Registry ID

0 references

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