(Q334337)

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Statements

government organization

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addresses subject

Atomic Layer Deposition Technology

383

1 reference

https://openalex.org/I4210117989

Nanoelectronics and Transistors

189

1 reference

https://openalex.org/I4210117989

Failure Analysis of Integrated Circuits

175

1 reference

https://openalex.org/I4210117989

Silicon Photonics Technology

145

1 reference

https://openalex.org/I4210117989

Infrared Detector Technologies

85

1 reference

https://openalex.org/I4210117989

Power Electronics Technology

80

1 reference

https://openalex.org/I4210117989

Dual-Energy Computed Tomography

73

1 reference

https://openalex.org/I4210117989

Diamond Nanotechnology and Applications

72

1 reference

https://openalex.org/I4210117989

Silicon Solar Cell Technology

70

1 reference

https://openalex.org/I4210117989

Low Dielectric Constant Materials for Microelectronics

68

1 reference

https://openalex.org/I4210117989

Quantum Dot Devices and Semiconductors

68

1 reference

https://openalex.org/I4210117989

Optical Interconnect Technologies

66

1 reference

https://openalex.org/I4210117989

Physics and Chemistry of Schottky Barrier Height

62

1 reference

https://openalex.org/I4210117989

Scintillation Detector Technology

59

1 reference

https://openalex.org/I4210117989

Solid-State Laser Technology

57

1 reference

https://openalex.org/I4210117989

Positron Emission Tomography Imaging in Oncology

57

1 reference

https://openalex.org/I4210117989

Porous Silicon Nanoparticles and Nanostructures

56

1 reference

https://openalex.org/I4210117989

Plasmonics for Photovoltaic Devices

55

1 reference

https://openalex.org/I4210117989

Cryptanalysis of Block Ciphers and Hash Functions

52

1 reference

https://openalex.org/I4210117989

Nanowire Nanosensors for Biomedical and Energy Applications

50

1 reference

https://openalex.org/I4210117989

Neutron Imaging and Analysis Techniques

47

1 reference

https://openalex.org/I4210117989

Three-Dimensional Integrated Circuits

46

1 reference

https://openalex.org/I4210117989

Ion Beam Surface Analysis and Nanoscale Patterning

45

1 reference

https://openalex.org/I4210117989

Mechanical Properties of Thin Film Coatings

42

1 reference

https://openalex.org/I4210117989

coordinate location

45°10'43"N, 5°42'53"E

1 reference

https://openalex.org/I4210117989

French Republic

1 reference

https://openalex.org/I4210117989

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Research Organization Registry ID

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is subsidiary of

Commissariat à l'Énergie Atomique et aux Énergies Alternatives

1 reference

https://openalex.org/I4210117989

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