Focused ion beam and field-emission microscopy of metallic filaments in memory devices based on thin films of an ambipolar organic compound consisting of oxadiazole, carbazole, and fluorene units (Q244257)
From geokb
Journal Article published in 2013
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Focused ion beam and field-emission microscopy of metallic filaments in memory devices based on thin films of an ambipolar organic compound consisting of oxadiazole, carbazole, and fluorene units |
Journal Article published in 2013 |
