Fabric Defect Detection in Industrial Applications (Q167331)

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Revision as of 13:38, 30 August 2024 by Sky (talk | contribs) (‎Changed label, description and/or aliases in en, and other parts: modified description with assistance from Llama 3.1)
Automated fabric defect detection using machine vision and deep learning in industrial settings.
  • Fabric Defect Detection
  • Machine Vision
  • Texture Analysis
  • Semiconductor Manufacturing
  • Wafer Map Defect Classification
  • Gabor Filters
  • Automated Inspection
  • Surface Defect Detection
  • Virtual Metrology
Language Label Description Also known as
English
Fabric Defect Detection in Industrial Applications
Automated fabric defect detection using machine vision and deep learning in industrial settings.
  • Fabric Defect Detection
  • Machine Vision
  • Texture Analysis
  • Semiconductor Manufacturing
  • Wafer Map Defect Classification
  • Gabor Filters
  • Automated Inspection
  • Surface Defect Detection
  • Virtual Metrology

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