Defect Identification using Positron Annihilation Spectroscopy (Q168350): Difference between revisions
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Revision as of 12:29, 8 September 2024
Using positron annihilation to detect defects in materials like semiconductors, polymers.
- Positron Annihilation
- Defect Identification
- Semiconductors
- Porous Materials
- Annihilation Lifetime
- Free Volume
- Nanostructures
- Polymers
- Muons
- Spectroscopy
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Defect Identification using Positron Annihilation Spectroscopy |
Using positron annihilation to detect defects in materials like semiconductors, polymers. |
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