Fabric Defect Detection in Industrial Applications (Q167331): Difference between revisions
From geokb
(Changed label, description and/or aliases in en, and other parts: removed Deep Learning from aliases; added Q169133 to addresses subject) |
(Changed label, description and/or aliases in en, and other parts: modified description with assistance from Llama 3.1) |
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| description / en | description / en | ||
Automated fabric defect detection using machine vision and deep learning in industrial settings. | |||
Revision as of 13:38, 30 August 2024
Automated fabric defect detection using machine vision and deep learning in industrial settings.
- Fabric Defect Detection
- Machine Vision
- Texture Analysis
- Semiconductor Manufacturing
- Wafer Map Defect Classification
- Gabor Filters
- Automated Inspection
- Surface Defect Detection
- Virtual Metrology
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Fabric Defect Detection in Industrial Applications |
Automated fabric defect detection using machine vision and deep learning in industrial settings. |
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