Fabric Defect Detection in Industrial Applications (Q167331): Difference between revisions
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Revision as of 18:48, 24 June 2024
This cluster of papers focuses on the application of machine vision, texture analysis, and deep learning techniques for the automated detection and classification of fabric defects in industrial settings, particularly in semiconductor manufacturing
- Fabric Defect Detection
- Machine Vision
- Texture Analysis
- Semiconductor Manufacturing
- Wafer Map Defect Classification
- Gabor Filters
- Automated Inspection
- Surface Defect Detection
- Virtual Metrology
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Fabric Defect Detection in Industrial Applications |
This cluster of papers focuses on the application of machine vision, texture analysis, and deep learning techniques for the automated detection and classification of fabric defects in industrial settings, particularly in semiconductor manufacturing |
|
