Ion Beam Surface Analysis and Nanoscale Patterning (Q166924): Difference between revisions
From geokb
(Changed label, description and/or aliases in en, and other parts: modified description with assistance from Llama 3.1) |
(Changed an Item: moved OpenAlex ID to its dedicated external ID datatype for consistency) |
||
| Property / same as | |||
| Property / same as: https://openalex.org/T12166 / rank | |||
| Property / OpenAlex ID | |||
| Property / OpenAlex ID: T12166 / rank | |||
Normal rank | |||
Revision as of 12:13, 8 September 2024
"Using ion beams to analyze surfaces and create tiny patterns at the nanoscale."
- Ion Beam
- Surface Analysis
- Secondary Ion Mass Spectrometry
- Nanoscale Patterning
- Cluster Ion
- Time-of-Flight
- Molecular Imaging
- Swift Heavy Ions
- Surface Engineering
- Nanostructures
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Ion Beam Surface Analysis and Nanoscale Patterning |
"Using ion beams to analyze surfaces and create tiny patterns at the nanoscale." |
|
