Item talk:Q166924: Difference between revisions

From geokb
(Added OpenAlex topic data)
 
No edit summary
 
(One intermediate revision by the same user not shown)
Line 1: Line 1:
OpenAlex: !!python/object/new:pyalex.api.Topic
{
   dictitems:
   "OpenAlex": {
     cited_by_count: 887998
     "display_name": "Ion Beam Surface Analysis and Nanoscale Patterning",
    created_date: '2024-01-23'
     "description": "This cluster of papers focuses on the use of ion beam techniques, such as Secondary Ion Mass Spectrometry (SIMS) and swift heavy ions, for surface analysis, nanoscale patterning, and molecular imaging. It covers a wide range of applications including surface engineering, nanostructure fabrication, and depth profiling of biological samples.",
     description: This cluster of papers focuses on the use of ion beam techniques,
     "keywords": [
      such as Secondary Ion Mass Spectrometry (SIMS) and swift heavy ions, for surface
       "Ion Beam",
      analysis, nanoscale patterning, and molecular imaging. It covers a wide range
      "Surface Analysis",
      of applications including surface engineering, nanostructure fabrication, and
      "Secondary Ion Mass Spectrometry",
      depth profiling of biological samples.
      "Nanoscale Patterning",
     display_name: Ion Beam Surface Analysis and Nanoscale Patterning
      "Cluster Ion",
    domain:
      "Time-of-Flight",
      display_name: Physical Sciences
      "Molecular Imaging",
      id: https://openalex.org/domains/3
      "Swift Heavy Ions",
    field:
      "Surface Engineering",
       display_name: Engineering
      "Nanostructures"
      id: https://openalex.org/fields/22
     ],
    id: https://openalex.org/T12166
     "ids": {
    ids:
       "openalex": "https://openalex.org/T12166",
      openalex: https://openalex.org/T12166
       "wikipedia": "https://en.wikipedia.org/wiki/Secondary_ion_mass_spectrometry"
      wikipedia: https://en.wikipedia.org/wiki/Secondary_ion_mass_spectrometry
     },
    keywords:
     "subfield": {
    - Ion Beam
       "id": "https://openalex.org/subfields/2206",
    - Surface Analysis
       "display_name": "Computational Mechanics"
    - Secondary Ion Mass Spectrometry
     },
    - Nanoscale Patterning
     "field": {
    - Cluster Ion
       "id": "https://openalex.org/fields/22",
    - Time-of-Flight
       "display_name": "Engineering"
    - Molecular Imaging
     },
    - Swift Heavy Ions
     "domain": {
    - Surface Engineering
       "id": "https://openalex.org/domains/3",
    - Nanostructures
       "display_name": "Physical Sciences"
     siblings:
     },
     - display_name: Adaptive Filtering in Non-Gaussian Signal Processing
     "updated_date": "2024-08-12T05:56:06.482309",
       id: https://openalex.org/T11233
     "created_date": "2024-01-23",
    - display_name: Analysis of Three-Dimensional Shape Structures
     "type": "topic",
      id: https://openalex.org/T10719
     "oa_id": "T12166",
    - display_name: Application of Extension Theory in Engineering and Innovation
     "id": "https://openalex.org/T12166"
       id: https://openalex.org/T14262
  }
    - display_name: Application of Morphological Analysis in Science and Technology
}
      id: https://openalex.org/T13307
    - display_name: Characterization of Surface Roughness in Optical Components
      id: https://openalex.org/T13049
     - display_name: Computational Fluid Dynamics
      id: https://openalex.org/T10173
     - display_name: Dynamics and Stability of Thin Liquid Films
       id: https://openalex.org/T12141
    - display_name: Dynamics of Drop Impact on Surfaces
      id: https://openalex.org/T11382
    - display_name: Dynamics of Granular Flow Systems
       id: https://openalex.org/T10615
    - display_name: Dynamics of Turbulent Combustion Systems
      id: https://openalex.org/T10553
     - display_name: Femtosecond Laser Micromachining in Transparent Materials
      id: https://openalex.org/T10732
     - display_name: Finite Element Methods for Fluid-Structure Interaction
       id: https://openalex.org/T10339
    - display_name: Fluid Dynamics and Engineering Applications
      id: https://openalex.org/T12565
    - display_name: Fundamentals of Fluid Dynamics and Mechanics
       id: https://openalex.org/T13951
    - display_name: Fundamentals of Heat Transfer and Numerical Methods
      id: https://openalex.org/T13116
     - display_name: Heat Transfer in Porous Media and Packed Beds
      id: https://openalex.org/T12063
     - display_name: Heat Transfer to Supercritical Fluids in Channels
       id: https://openalex.org/T12567
    - display_name: Inverse Radiative Heat Transfer Analysis
      id: https://openalex.org/T12304
    - display_name: Isogeometric Analysis in Computational Engineering
       id: https://openalex.org/T11245
    - display_name: Lattice Boltzmann Method for Complex Flows
      id: https://openalex.org/T11751
     - display_name: Modeling and Analysis of Laser Forming Process
      id: https://openalex.org/T13965
     - display_name: Modeling and Optimization of Cyclone Separators
      id: https://openalex.org/T12540
    - display_name: Multidisciplinary Research in Science and Technology
      id: https://openalex.org/T14252
    - display_name: Optical 3D Laser Measurement Systems Optimization
      id: https://openalex.org/T14163
     - display_name: Smoothed Particle Hydrodynamics in Fluid Dynamics
      id: https://openalex.org/T11694
    - display_name: Theory and Applications of Compressed Sensing
      id: https://openalex.org/T10500
    - display_name: Thermophoresis and Thermodiffusion Studies
      id: https://openalex.org/T12850
     - display_name: Turbulent Flows and Vortex Dynamics
      id: https://openalex.org/T10360
     - display_name: Vortex-Induced Vibrations in Fluid Flow
      id: https://openalex.org/T11254
     subfield:
      display_name: Computational Mechanics
      id: https://openalex.org/subfields/2206
    updated_date: '2024-05-20T05:10:07.677396'
    works_count: 69186

Latest revision as of 20:14, 12 September 2024

{

 "OpenAlex": {
   "display_name": "Ion Beam Surface Analysis and Nanoscale Patterning",
   "description": "This cluster of papers focuses on the use of ion beam techniques, such as Secondary Ion Mass Spectrometry (SIMS) and swift heavy ions, for surface analysis, nanoscale patterning, and molecular imaging. It covers a wide range of applications including surface engineering, nanostructure fabrication, and depth profiling of biological samples.",
   "keywords": [
     "Ion Beam",
     "Surface Analysis",
     "Secondary Ion Mass Spectrometry",
     "Nanoscale Patterning",
     "Cluster Ion",
     "Time-of-Flight",
     "Molecular Imaging",
     "Swift Heavy Ions",
     "Surface Engineering",
     "Nanostructures"
   ],
   "ids": {
     "openalex": "https://openalex.org/T12166",
     "wikipedia": "https://en.wikipedia.org/wiki/Secondary_ion_mass_spectrometry"
   },
   "subfield": {
     "id": "https://openalex.org/subfields/2206",
     "display_name": "Computational Mechanics"
   },
   "field": {
     "id": "https://openalex.org/fields/22",
     "display_name": "Engineering"
   },
   "domain": {
     "id": "https://openalex.org/domains/3",
     "display_name": "Physical Sciences"
   },
   "updated_date": "2024-08-12T05:56:06.482309",
   "created_date": "2024-01-23",
   "type": "topic",
   "oa_id": "T12166",
   "id": "https://openalex.org/T12166"
 }

}