Ion Beam Surface Analysis and Nanoscale Patterning (Q166924): Difference between revisions

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Ion Beam
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Surface Analysis
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Secondary Ion Mass Spectrometry
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Nanoscale Patterning
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Cluster Ion
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Time-of-Flight
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Molecular Imaging
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Swift Heavy Ions
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Surface Engineering
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Nanostructures
description / endescription / en
This cluster of papers focuses on the use of ion beam techniques, such as Secondary Ion Mass Spectrometry (SIMS) and swift heavy ions, for surface analysis, nanoscale patterning, and molecular imaging
Using ion beams to analyze surfaces and create tiny patterns at the nanoscale.
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Latest revision as of 20:57, 21 September 2024

Using ion beams to analyze surfaces and create tiny patterns at the nanoscale.
Language Label Description Also known as
English
Ion Beam Surface Analysis and Nanoscale Patterning
Using ion beams to analyze surfaces and create tiny patterns at the nanoscale.

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    OpenAlex ID
    T12166
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