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(Replaced content with "{ "OpenAlex": { "display_name": "Reverberation Chambers in Electromagnetic Testing", "description": "This cluster of papers focuses on the use of reverberation chambers in electromagnetic testing, particularly for antenna measurements, near-field scanning, MIMO systems, electromagnetic shielding, source reconstruction, mode-stirred chambers, EMI testing, far-field transformation, and wireless device testing.", "keywords": [ "Reverberation Chambers...")
Tag: Replaced
 
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{
{
   "id": "https://openalex.org/T11851",
   "OpenAlex": {
  "display_name": "Reverberation Chambers in Electromagnetic Testing",
    "display_name": "Reverberation Chambers in Electromagnetic Testing",
  "description": "This cluster of papers focuses on the use of reverberation chambers in electromagnetic testing, particularly for antenna measurements, near-field scanning, MIMO systems, electromagnetic shielding, source reconstruction, mode-stirred chambers, EMI testing, far-field transformation, and wireless device testing.",
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  "keywords": [
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    "Reverberation Chambers",
      "Reverberation Chambers",
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      "Near-Field Scanning",
    "MIMO Systems",
      "MIMO Systems",
    "Electromagnetic Shielding",
      "Electromagnetic Shielding",
    "Source Reconstruction",
      "Source Reconstruction",
    "Mode-Stirred Chambers",
      "Mode-Stirred Chambers",
    "EMI Testing",
      "EMI Testing",
    "Far-Field Transformation",
      "Far-Field Transformation",
    "Wireless Device Testing"
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  ],
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}

Latest revision as of 20:37, 12 September 2024

{

 "OpenAlex": {
   "display_name": "Reverberation Chambers in Electromagnetic Testing",
   "description": "This cluster of papers focuses on the use of reverberation chambers in electromagnetic testing, particularly for antenna measurements, near-field scanning, MIMO systems, electromagnetic shielding, source reconstruction, mode-stirred chambers, EMI testing, far-field transformation, and wireless device testing.",
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     "EMI Testing",
     "Far-Field Transformation",
     "Wireless Device Testing"
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   "created_date": "2024-01-23",
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 }

}