Focused ion beam and field-emission microscopy of metallic filaments in memory devices based on thin films of an ambipolar organic compound consisting of oxadiazole, carbazole, and fluorene units (Q244257): Difference between revisions
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Latest revision as of 17:25, 8 September 2024
Journal Article published in 2013
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Focused ion beam and field-emission microscopy of metallic filaments in memory devices based on thin films of an ambipolar organic compound consisting of oxadiazole, carbazole, and fluorene units |
Journal Article published in 2013 |
