Ion Beam Surface Analysis and Nanoscale Patterning (Q166924): Difference between revisions
From geokb
(Created a new Item: Added new OpenAlex topic claimed by USGS staff from API) |
(Changed label, description and/or aliases in en, and other parts: modified description with assistance from Llama 3.1) |
||
| description / en | description / en | ||
"Using ion beams to analyze surfaces and create tiny patterns at the nanoscale." | |||
Revision as of 13:21, 30 August 2024
"Using ion beams to analyze surfaces and create tiny patterns at the nanoscale."
- Ion Beam
- Surface Analysis
- Secondary Ion Mass Spectrometry
- Nanoscale Patterning
- Cluster Ion
- Time-of-Flight
- Molecular Imaging
- Swift Heavy Ions
- Surface Engineering
- Nanostructures
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Ion Beam Surface Analysis and Nanoscale Patterning |
"Using ion beams to analyze surfaces and create tiny patterns at the nanoscale." |
|
