Michael Wieczorek (Q140384): Difference between revisions
From geokb
(Created a new Item: Person record added from ORCID registry based on ORCID ID found as author/contributor to USGS publication) |
(Changed an Item: added knows about claims from OpenAlex topics) |
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Property / OpenAlex ID | |||||||||||||||
Property / OpenAlex ID: A5063669951 / rank | |||||||||||||||
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Property / OpenAlex ID: A5063669951 / qualifier | |||||||||||||||
last update: 19 August 2024
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Property / OpenAlex ID: A5063669951 / qualifier | |||||||||||||||
retrieved: 29 August 2024
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Property / knows about | |||||||||||||||
Property / knows about: X-ray Imaging Techniques and Applications / rank | |||||||||||||||
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Property / knows about: X-ray Imaging Techniques and Applications / qualifier | |||||||||||||||
last update: 19 August 2024
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Property / knows about: X-ray Imaging Techniques and Applications / qualifier | |||||||||||||||
prevalence: 10
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Property / knows about: X-ray Imaging Techniques and Applications / reference | |||||||||||||||
Property / knows about | |||||||||||||||
Property / knows about: X-ray Absorption Spectroscopy / rank | |||||||||||||||
Normal rank | |||||||||||||||
Property / knows about: X-ray Absorption Spectroscopy / qualifier | |||||||||||||||
last update: 19 August 2024
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Property / knows about: X-ray Absorption Spectroscopy / qualifier | |||||||||||||||
prevalence: 8
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Property / knows about: X-ray Absorption Spectroscopy / reference | |||||||||||||||
Property / knows about | |||||||||||||||
Property / knows about: Chemical Mechanical Polishing in Microelectronics Manufacturing / rank | |||||||||||||||
Normal rank | |||||||||||||||
Property / knows about: Chemical Mechanical Polishing in Microelectronics Manufacturing / qualifier | |||||||||||||||
last update: 19 August 2024
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Property / knows about: Chemical Mechanical Polishing in Microelectronics Manufacturing / qualifier | |||||||||||||||
prevalence: 5
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Property / knows about: Chemical Mechanical Polishing in Microelectronics Manufacturing / reference | |||||||||||||||
Property / knows about | |||||||||||||||
Property / knows about: Powder Diffraction Analysis / rank | |||||||||||||||
Normal rank | |||||||||||||||
Property / knows about: Powder Diffraction Analysis / qualifier | |||||||||||||||
last update: 19 August 2024
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Property / knows about: Powder Diffraction Analysis / qualifier | |||||||||||||||
prevalence: 5
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Property / knows about: Powder Diffraction Analysis / reference | |||||||||||||||
Property / knows about | |||||||||||||||
Property / knows about: Interaction of Particles with Crystalline Fields / rank | |||||||||||||||
Normal rank | |||||||||||||||
Property / knows about: Interaction of Particles with Crystalline Fields / qualifier | |||||||||||||||
last update: 19 August 2024
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Property / knows about: Interaction of Particles with Crystalline Fields / qualifier | |||||||||||||||
prevalence: 4
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Property / knows about: Interaction of Particles with Crystalline Fields / reference | |||||||||||||||
Property / knows about | |||||||||||||||
Property / knows about: Mantle Dynamics and Earth's Structure / rank | |||||||||||||||
Normal rank | |||||||||||||||
Property / knows about: Mantle Dynamics and Earth's Structure / qualifier | |||||||||||||||
last update: 19 August 2024
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Property / knows about: Mantle Dynamics and Earth's Structure / qualifier | |||||||||||||||
prevalence: 4
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Property / knows about: Mantle Dynamics and Earth's Structure / reference | |||||||||||||||
Property / knows about | |||||||||||||||
Property / knows about: Cryo-Electron Microscopy Techniques / rank | |||||||||||||||
Normal rank | |||||||||||||||
Property / knows about: Cryo-Electron Microscopy Techniques / qualifier | |||||||||||||||
last update: 19 August 2024
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Property / knows about: Cryo-Electron Microscopy Techniques / qualifier | |||||||||||||||
prevalence: 3
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Property / knows about: Cryo-Electron Microscopy Techniques / reference | |||||||||||||||
Property / knows about | |||||||||||||||
Property / knows about: Electron Beam Lithography: Resolution and Applications / rank | |||||||||||||||
Normal rank | |||||||||||||||
Property / knows about: Electron Beam Lithography: Resolution and Applications / qualifier | |||||||||||||||
last update: 19 August 2024
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Property / knows about: Electron Beam Lithography: Resolution and Applications / qualifier | |||||||||||||||
prevalence: 2
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Property / knows about: Electron Beam Lithography: Resolution and Applications / reference | |||||||||||||||
Property / knows about | |||||||||||||||
Property / knows about: Antireflective Thin-Film Materials / rank | |||||||||||||||
Normal rank | |||||||||||||||
Property / knows about: Antireflective Thin-Film Materials / qualifier | |||||||||||||||
last update: 19 August 2024
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Property / knows about: Antireflective Thin-Film Materials / qualifier | |||||||||||||||
prevalence: 1
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Property / knows about: Antireflective Thin-Film Materials / reference | |||||||||||||||
Property / knows about | |||||||||||||||
Property / knows about: Ion Beam Surface Analysis and Nanoscale Patterning / rank | |||||||||||||||
Normal rank | |||||||||||||||
Property / knows about: Ion Beam Surface Analysis and Nanoscale Patterning / qualifier | |||||||||||||||
last update: 19 August 2024
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Property / knows about: Ion Beam Surface Analysis and Nanoscale Patterning / qualifier | |||||||||||||||
prevalence: 1
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Property / knows about: Ion Beam Surface Analysis and Nanoscale Patterning / reference | |||||||||||||||
Property / knows about | |||||||||||||||
Property / knows about: Dual-Energy Computed Tomography / rank | |||||||||||||||
Normal rank | |||||||||||||||
Property / knows about: Dual-Energy Computed Tomography / qualifier | |||||||||||||||
last update: 19 August 2024
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Property / knows about: Dual-Energy Computed Tomography / qualifier | |||||||||||||||
prevalence: 1
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Property / knows about: Dual-Energy Computed Tomography / reference | |||||||||||||||
Property / knows about | |||||||||||||||
Property / knows about: High-Strength Steel Materials / rank | |||||||||||||||
Normal rank | |||||||||||||||
Property / knows about: High-Strength Steel Materials / qualifier | |||||||||||||||
last update: 19 August 2024
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Property / knows about: High-Strength Steel Materials / qualifier | |||||||||||||||
prevalence: 1
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Property / knows about: High-Strength Steel Materials / reference | |||||||||||||||
Property / knows about | |||||||||||||||
Property / knows about: Surface Analysis and Electron Spectroscopy Techniques / rank | |||||||||||||||
Normal rank | |||||||||||||||
Property / knows about: Surface Analysis and Electron Spectroscopy Techniques / qualifier | |||||||||||||||
last update: 19 August 2024
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Property / knows about: Surface Analysis and Electron Spectroscopy Techniques / qualifier | |||||||||||||||
prevalence: 1
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Property / knows about: Surface Analysis and Electron Spectroscopy Techniques / reference | |||||||||||||||
Property / knows about | |||||||||||||||
Property / knows about: Crystallization Processes and Control / rank | |||||||||||||||
Normal rank | |||||||||||||||
Property / knows about: Crystallization Processes and Control / qualifier | |||||||||||||||
last update: 19 August 2024
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Property / knows about: Crystallization Processes and Control / qualifier | |||||||||||||||
prevalence: 1
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Property / knows about: Crystallization Processes and Control / reference | |||||||||||||||
Revision as of 00:48, 30 August 2024
a record for a person added from ORCID based on a contributor to a USGS publication
Language | Label | Description | Also known as |
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English | Michael Wieczorek |
a record for a person added from ORCID based on a contributor to a USGS publication |
Statements
19 August 2024
10
1 reference
19 August 2024
1 reference
19 August 2024
1 reference
19 August 2024
1 reference
19 August 2024
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19 August 2024
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19 August 2024
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19 August 2024
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19 August 2024
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19 August 2024
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19 August 2024
1 reference
19 August 2024
1 reference
19 August 2024
1 reference
19 August 2024
1 reference